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System and method for device inspection

A technology for equipment components and inspection equipment, applied in image analysis, machine learning, image enhancement, etc., can solve problems such as inaccurate results, equipment failures, equipment outages, etc.

Pending Publication Date: 2022-07-12
GE GLOBAL SOURCING LLC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, adherence to the process may vary from inspector to inspector, which may lead to inaccurate results
Inspectors may not have access to previous inspection results, making it difficult to determine whether previous inspections were performed according to established processes
A failure of a component could cause equipment (such as a locomotive) to malfunction if it is inspected and incorrectly identified as undamaged or not defective
Conversely, if a part is inspected and incorrectly identified as damaged or defective, unnecessary part replacement can take the unit out of service and result in additional repair costs

Method used

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  • System and method for device inspection
  • System and method for device inspection
  • System and method for device inspection

Examples

Experimental program
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Effect test

Embodiment Construction

[0020] Embodiments of the subject matter described herein relate to systems and methods for improving and validating inspection quality and compliance with established inspection processes and procedures by simultaneously providing inspection feedback during the inspection process. The system and method provide a way to track the inspection process by, for example, images, dates, parts, locations, and inspectors. The system and method can automatically track and identify non-compliant or risky inspections to allow follow-up actions to reduce the risk of non-compliant inspections.

[0021] Proper inspection of equipment components requires that inspection criteria be completed prior to performing the inspection. For example, parts can be cleaned in areas to be inspected, cleaned areas can be scribed or delineated to indicate clean areas versus other areas, and parts can be numbered to allow inspection results to be consistent with inspected parts. Failure to complete the test ...

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PUM

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Abstract

Methods and systems for device inspection. According to one example, the method includes receiving image data representing an appearance of an equipment component prior to an inspection process, and evaluating the image data using a machine learning model defining reference image data to determine whether the image data represents that the equipment component has been prepared for inspection. When the evaluation indicates that the equipment component has not been prepared, the inspection process may be blocked. According to one example, the system includes a controller that receives image data representing an appearance of an equipment component obtained prior to an inspection process. The controller evaluates the image data with respect to the reference image data using a machine learning model to determine whether the equipment component has been prepared for the inspection process. The controller prevents proceeding of the inspection process based on the evaluation indicating that no equipment component has been prepared for the inspection process.

Description

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS [0002] This application claims priority to US Provisional Application 63 / 130,085, filed December 23, 2020, and US Non-Provisional Application 17 / 523,343, filed November 10, 2021, the entire disclosures of which are incorporated herein by reference. technical field [0003] The disclosed subject matter described herein relates to systems and methods for testing devices. More particularly, the disclosed subject matter described herein relates to systems and methods for evaluating visual inspection criteria, providing feedback and / or evaluation of visual inspection criteria, and providing tracking and notification of visual inspection criteria. Background technique [0004] Inspection of equipment such as vehicle components to detect potentially damaged or defective, or near damaged or defective components. Inspection can be performed according to the procedures established for each part. However, adherence to the process may v...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/11G06N20/00
CPCG06T7/0002G06T7/11G06N20/00G06T2207/20081G06T2207/30204G06T2207/20084G06T2207/10016G06T7/0004G06T7/001G06T2207/30164
Inventor M·卡鲁那拉特N·T·诺思
Owner GE GLOBAL SOURCING LLC