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Suspension type scanning method for metal in-situ analyzer and sample clamp therefor

An in-situ analyzer and scanning method technology, applied in the field of analyzing materials, can solve problems such as instrument analysis errors

Active Publication Date: 2006-05-03
NCS TESTING TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Based on the above measurement principle, the composition and distribution of the surface atoms of the sample to be tested have a decisive influence on the test results, so other materials attached to the surface of the sample to be tested will definitely affect the accurate analysis of the content and distribution of the corresponding elements contained in the sample to be tested , therefore, when the atoms on the surface of the scanning platform will adhere to the surface of the sample to be tested, it will inevitably cause the analysis error of the instrument

Method used

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  • Suspension type scanning method for metal in-situ analyzer and sample clamp therefor
  • Suspension type scanning method for metal in-situ analyzer and sample clamp therefor

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Embodiment

[0019] Adopt the metal in-situ analyzer suspension scanning method described in the present invention, on the scanning platform of the metal in-situ analyzer, three samples with good uniformity-alloyed high-strength plate SG11#, continuous casting thin slab SG751#, Billet SG121# implements suspension scanning analysis. The material of the scanning platform is brass with the grade H90. For comparison, on the scanning platform of the same metal in-situ analyzer, three samples were also subjected to contact scanning analysis, that is, directly between the sample and the copper scanning platform. The occurrence of friction was scanned and analyzed. The specific analysis steps are as follows:

[0020] Step 1: First process three samples to be tested into a flat surface, and use sandpaper or a grinder to grind out a fresh surface. After the sample to be tested is in close contact with the scanning platform (brass with brand H90), it is clamped on the continuous excitation and synchr...

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Abstract

The invention relates to a plane scanner method and sample holder in the field of analysis material by the physical property of the tested material. The method uses the sample holder to hold the tested sample and adjusts the ball top thread of the holder so that the sample can float on the scan plane, the mental home position analysis apparatus dose low energy, non-perfiring and continues motive-scanning to achieve the float scanning. The sample holder is formed by a front rod, a rear rod, breakthrough interlocks, a ball top thread and screw covers, wherein the front and rear rods are paralleled with the two breakthrough interlocks; the front and rear rods are vertical to the two breakthrough interlocks; the screw covers are fixed on the two ends of the front and rear rods; the screw cover has breakthrough inner screw; the ball top thread is rotated on the screw cover; it adjusts the ball top thread so that the sample can float on the scan plane with a certain distance; the whole sample holder is connected with the scanner by connecting rod.

Description

technical field [0001] The invention belongs to the field of analyzing materials by means of measuring the physical properties of materials, and mainly relates to a plane scanner method and a sample fixture Background technique [0002] The metal original situ analyzer is used to solve the quantitative analysis of element chemical composition, element segregation analysis, material loose analysis and quantitative analysis of inclusions in iron and steel materials. However, when the metal in situ analyzer is testing and analyzing the sample, the sample and the scanning platform are in close contact during the contact scanning process of the sample using a flat scanner, so in the process of movement, the sample and the scanning platform do not interact with each other. There must be friction between the contact surfaces during relative movement (the size of the friction depends on the weight of the sample to be tested and the fixture). Under the action of this friction, the at...

Claims

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Application Information

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IPC IPC(8): G01N21/63
Inventor 王海舟杨新生张秀鑫彭向阳李美玲陈永彦常丽莉胡炎王辉
Owner NCS TESTING TECH
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