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In-cycle system test adaptation

a system test and system technology, applied in the field of system testing, can solve problems such as inability to take into account the abilities and weaknesses of any particular development team at any given time, and contractors may have little experience with deployment tools, product design, environment and user cases

Inactive Publication Date: 2008-07-03
INT BUSINESS MASCH CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This approach ensures that system tests are dynamically updated to address actual product performance issues, improving defect detection and resource allocation by adapting to changes during the testing cycle, reducing the likelihood of missed defects and enhancing testing efficiency.

Problems solved by technology

One problem with the current state of system testing is that the system test plan is created prior the product being created.
Therefore, the abilities of any particular development team at any given point in time cannot be taken into account.
In any given development team at any particular point in time (which is a particular release cycle of the product) there are certain abilities and weaknesses.
For example, contractors may have little experience with deployment tools, the product design, environment and user cases for the product, and the like.
Accordingly, a design based system test plan is not an adequate method to discover defects in a product.
This causes test resources to be wasted on non-problematic areas leaving other areas not adequately tested.

Method used

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Examples

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Embodiment Construction

[0014]As required, detailed embodiments of the present invention are disclosed herein; however, it is to be understood that the disclosed embodiments are merely exemplary of the invention, which can be embodied in various forms. Therefore, specific structural and functional details disclosed herein are not to be interpreted as limiting, but merely as a basis for the claims and as a representative basis for teaching one skilled in the art to variously employ the present invention in virtually any appropriately detailed structure. Further, the terms and phrases used herein are not intended to be limiting; but rather, to provide an understandable description of the invention.

[0015]The terms “a” or “an”, as used herein, are defined as one or more than one. The term plurality, as used herein, is defined as two or more than two. The term another, as used herein, is defined as at least a second or more. The terms including and / or having, as used herein, are defined as comprising (i.e., ope...

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Abstract

Disclosed are an information processing system and computer readable medium for performing a system test on a program. A test plan associated with a system test is created. The system test is for testing a program within an environment. At least one test trigger to be monitored for during the system test is defined within the test plan. Execution of the system test on a system under test for the at least one test trigger is monitored. An occurrence of the at least one test trigger is determined. The test plan is modified to take into account the occurrence of the at least one test trigger in response to determining the occurrence. Execution of the system test is continued based on the modified test plan.

Description

FIELD OF THE INVENTION[0001]The present invention generally relates to the field of system testing, and more particularly relates to dynamically adapting system test procedures during the testing cycle.BACKGROUND OF THE INVENTION[0002]System testing is generally used to test a product such as a software application in an integrated system. A system can include software, hardware, and the like. Current methods for system testing of a product begin with building a test plan. The test plan provides a sparse coverage matrix of a particular product based on its documented design and customer usage cases. The documented design and customer usage cases are generated prior to the product's creation. The system test plan is one of the measurement devices that is used to determine if the quality and function of the product has been verified. After the product is created it can be system tested to identify defects and behavior anomalies, which are reported by the testers. Usually a subset of t...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): G06F11/36
CPCG06F11/3688
Inventor BROWNE, MICHAEL E.WACK, ANDREW P.LEMAY, MONICA J.GAVIN, DERWIN D.
Owner INT BUSINESS MASCH CORP
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