In-cycle system test adaptation

Abstract

Disclosed are an information processing system and computer readable medium for performing a system test on a program. A test plan associated with a system test is created. The system test is for testing a program within an environment. At least one test trigger to be monitored for during the system test is defined within the test plan. Execution of the system test on a system under test for the at least one test trigger is monitored. An occurrence of the at least one test trigger is determined. The test plan is modified to take into account the occurrence of the at least one test trigger in response to determining the occurrence. Execution of the system test is continued based on the modified test plan.

Description

FIELD OF THE INVENTION[0001]The present invention generally relates to the field of system testing, and more particularly relates to dynamically adapting system test procedures during the testing cycle.BACKGROUND OF THE INVENTION[0002]System testing is generally used to test a product such as a software application in an integrated system. A system can include software, hardware, and the like. Current methods for system testing of a product begin with building a test plan. The test plan provides a sparse coverage matrix of a particular product based on its documented design and customer usage cases. The documented design and customer usage cases are generated prior to the product's creation. The system test plan is one of the measurement devices that is used to determine if the quality and function of the product has been verified. After the product is created it can be system tested to identify defects and behavior anomalies, which are reported by the testers. Usually a subset of t...

AI Technical Summary

Benefits of technology

[0009]One advantage of the present invention is a new system test process is provided. Test triggers can be defined prior to the start of a system test cycle for triggering a test modification analysis. Based on this triggered analysis, the system test can be dynamically updated with new test cases that are executed in the current test cycle. Therefore, the system test is not completely defined by a design specification, but can be adapted based on the actual product's performance. Another advantage is that the test triggers are self-learning in that once a particular trigger has occurred additional triggers can be created based on the in-cycle learning at that point.

is a new system test process is provided. Test triggers can be defined prior to the start of a system test cycle for triggering a test modification analysis. Based on this triggered analysis, the system test can be dynamically updated with new test cases that are executed in the current test cycle. Therefore, the system test is not completely defined by a design specification, but can be adapted based on the actual product's performance. Another advantage is that the test triggers are self-learning in that once a particular trigger has occurred additional triggers can be created based on the in-cycle learning at that point.

Problems solved by technology

One problem with the current state of system testing is that the system test plan is created prior the product being created.

Therefore, the abilities of any particular development team at any given point in time cannot be taken into account.

In any given development team at any particular point in time (which is a particular release cycle of the product) there are certain abilities and weaknesses.

For example, contractors may have little experience with deployment tools, the product design, environment and user cases for the product, and the like.

Accordingly, a design based system test plan is not an adequate method to discover defects in a product.

This causes test resources to be wasted on non-problematic areas leaving other areas not adequately tested.

Images