Method of testing durability of CIS based thin-film solar cell module

Abstract

The property of CIS based thin-film solar cell modules that the modules recover their conversion efficiency, etc. upon irradiation with a weak light is correctly evaluated. A CIS based thin-film solar cell module is subjected to a conventional damp heat test with a constant-light solar simulator (solar simulator) 1D in such a manner that the power of the light source 1E is regulated so that the solar simulator 1D emits a weak light corresponding to the amount of solar radiation in cloudy weather, i.e., resulting in an irradiance of 100-300 W / m2, and the module is continuously irradiated with the weak light throughout the test period under the same temperature, humidity, and storage period conditions as those in the conventional conditions for the test (1,000-hour storage in the dark at a temperature of 85° C. and a relative humidity of 85%). Thus, the property of the module 2′ that the module 2′ does not show considerable deterioration even after storage in an open state for 1,000 hours can be correctly evaluated.

Description

TECHNICAL FIELD[0001]The present invention relates to an improved method of testing the durability of a CIS based thin-film solar cell module.BACKGROUND ART[0002]The basic CIS based thin-film solar cell module proposed by the present applicants already came up to the IEC 61646 (International Electrotechnical Commission Standards 61646) (first edition). It is generally known that CIS based thin-film solar cell modules temporarily deteriorate in conversion efficiency through the 1,000-hour damp heat test as provided for in IEC 61646 (first edition) (test in which a sample is stored in the dark for 1,000 hours under the relatively high-temperature high-humidity conditions of a temperature of 85° C. and a relative humidity of 85%) but recover their conversion efficiency by light soaking after the test.[0003]The durability test for a CIS based thin-film solar cell module is conducted by the method according to IEC 61646 (first edition). With respect to individual test items, however, tes...

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Benefits of technology

[0016]The conventional durability test method based on the damp heat test as provided for in IEC 61646 (first edition) (test in which a sample is stored in the dark for 1,000 hours under the relatively high-temperature high-humidity conditions of a temperature of 85° C. and a relative humidity of 85%) failed to correctly and stably evaluate the characteristics of a CIS based thin-film solar cell module due to the temporary deterioration in conversion efficiency, etc. of the module. However, according to the improved durability test method of the invention, in which a CIS based thin-film solar cell module to be tested is stored under relatively high-temperature high-humidity conditions of a temperature of 85° C. and a relative humidity of 85% while continuously irradiating the module throughout the test period with a weak light corresponding to the amount of solar radiation in cloudy weather, it is possible to evaluate characteristics practically, correctly, and stably according to that property of CIS based thin-film solar cell modules by which the modules recover their solar cell characteristics including conversion efficiency.

Problems solved by technology

At present, the mechanism by which a CIS based thin-film solar cell module recovers by light soaking from the temporary deterioration resulting from the damp heat test has not been elucidated.

There has been a problem that the durability of CIS based thin-film solar cell modules is not correctly evaluated by the conventional method of damp heat test.

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