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Probe examination device

A technology for inspection devices and probes, applied to measuring devices, instruments, and measuring electronics, can solve problems such as time-consuming, difficult to measure, and large error range of probes

Inactive Publication Date: 2008-01-16
PEGATRON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, there is a wide range of error in using manual visual inspection to find out whether there is a protruding probe. If you touch the probe with your hand to feel whether the probe is protruding, the result will be different due to the different feelings of different inspectors.
However, using a cursor caliper to measure the protruding height of the probe on the probe holder has a fixed height value as a basis, but because this method must repeatedly measure each probe on the probe holder, it is quite expensive. Time, and when the position of the probe is dense, it will be difficult to measure, and the probe is flexible, and it is not easy to measure

Method used

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Embodiment Construction

[0039] A probe inspection device according to a preferred embodiment of the present invention will be described below with reference to related drawings, wherein the same components will be described with the same reference symbols.

[0040] 1 and 2, the probe inspection device 1 according to the embodiment of the present invention is used to inspect the installation situation of at least one probe 2 arranged on a probe holder 3, and at least a part of the probe 2 protrudes Out of probe holder 3. The probe inspection device 1 includes a first height stop 11 , a second height stop 12 and a height reference element 13 . The first height stopper 11 is placed on the probe holder 3 ; the second height stopper 12 is placed on the probe holder 3 . The height reference component 13 is connected to the first height stop 11 and the second height stop 12 , and the height reference component 13 has a height reference surface 131 .

[0041] The first height stopper 11 and the height refe...

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Abstract

The invention discloses a probe check device which checks the state in which at least one probe is installed on the probe support, and at least part of the probe leans out of the probe support. The probe check device includes a first height block, a second height block and a high standard element. The first and the second height blocks are set on the probe support. The height standard element links with the first and the second height blocks with a height standard plane. When push the standard element, probes higher than the standard plane will stop the element from moving.

Description

technical field [0001] The present invention relates to a probe inspection device, in particular to a probe inspection device for inspecting at least one probe installed on a probe holder. Background technique [0002] With the advancement of electronic technology, ordinary people have higher and higher requirements on the quality and price of electronic products. In order to produce high-quality and competitively priced electronic products, electronic product manufacturers not only continuously develop high-performance products, but also conduct precise and complete testing before the products leave the factory. Taking a circuit board as an example, after a circuit board is manufactured, it must be tested to detect whether the circuit board is defective. A general testing device includes a probe holder, and at least one probe is disposed on the probe holder, and uses the principle of pressing to make the surface of the circuit board contact with the tip of the probe to con...

Claims

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Application Information

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IPC IPC(8): G01R31/01G01R35/00
Inventor 郑长科郑君风王志鸿李祥铭
Owner PEGATRON