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System and method for collecting test data

A technology for testing data and data collection, applied in signal transmission systems, electrical signal transmission systems, instruments, etc., can solve problems such as waste of power resources and computers, and achieve the effect of saving power resources and computer equipment

Inactive Publication Date: 2009-07-22
MITAC COMP (SHUN DE) LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

To sum up, online testing of electronic products usually requires two computers, which will cause waste of power resources and computers, so the above problems are urgently needed to be solved

Method used

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  • System and method for collecting test data
  • System and method for collecting test data

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Embodiment Construction

[0009] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0010] As shown in Figure 1, the collection system of test data of the present invention comprises a computer 100, and this computer 100 comprises a test unit 110, a first storage unit 120, a second storage unit 130 and a detection unit 140, and this test unit 110, used to test electronic products and generate corresponding test data; the first storage unit 120 is connected to the test unit 110 and used to store the test data; the second storage unit 130 is used to map the first storage unit 120 to obtain the test data; the data detection unit 140 is used to detect the test data in the second storage unit 130; the test data collection system also includes a data collection server 200, which is connected to the second storage through a network The unit 130 is configured to receive the test data transmitted by the second storage unit 130 . In this embodiment, t...

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Abstract

The invention provides a method for collecting test data. Firstly, the test unit of the computer tests the electronic product and generates corresponding test data; then stores the test data on the first storage unit of the computer; then the second The test data stored in a storage unit is mapped and stored in the second storage unit of the computer; finally, the data detection unit detects the second storage unit in real time, and after detecting the test data, it transmits the data stored in the second storage unit. Test data to the data collection server. The test data collection method of the present invention only uses one computer to test the electronic product to generate corresponding test data and transmit it to the data collection server without adding another computer to collect the test data and transmit it to the data collection server. Thereby, power resources and computer equipment can be saved.

Description

technical field [0001] The invention relates to a test data collection system, in particular to a test data collection method. Background technique [0002] In the electronics manufacturing industry, electronic products need to be tested online and the test results need to be collected. Currently, online testing usually requires a test computer and a data collection computer. The test computer is used to test the electronic product , to generate test data and store it in the test computer, and then the test computer maps the test data to the data collection computer; the data collection computer scans the mapped test data in real time, and will send The test data is transmitted to the network server through a network switch, and the test result is deleted after the transmission is completed. To sum up, online testing of electronic products usually requires two computers, which will cause waste of power resources and computers, so the above problems are urgently needed to be...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G08C19/00
Inventor 涂和珍
Owner MITAC COMP (SHUN DE) LTD