Inspection apparatus and method

A technology for inspection devices and inspection procedures, applied to measuring devices, instruments, and measuring ultrasonic/sonic/infrasonic waves, etc., which can solve problems such as degradation of discrimination performance

Inactive Publication Date: 2007-11-14
ORMON CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Moreover, when there are few learning samples, it is also possible that the learning samples are relatively sparse in places where the density is originally high, so there is a risk that the discriminative performance will drop significantly.

Method used

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  • Inspection apparatus and method
  • Inspection apparatus and method
  • Inspection apparatus and method

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Embodiment Construction

[0095] Hereinafter, one embodiment of the present invention will be described with reference to the drawings.

[0096] FIG. 2 is an explanatory diagram showing an outline of the configuration of the inspection device 100 according to the present embodiment. FIG. 1 is a functional block diagram showing the configuration of a discriminant function determination unit 20 included in the inspection device 100 .

[0097] The inspection apparatus 100 of the present embodiment extracts feature quantities from the input measurement data of the inspection object. The inspection device 100 judges whether the sample is qualified or not through non-parametric discrimination based on the extracted feature quantity. And in particular, the inspection apparatus 100 has a discriminant function determination unit 20 . This discriminant function determination unit 20 has the following functions: (1) to determine whether the discriminant function used in the non-parametric one-class discriminati...

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Abstract

The invention provides an inspection apparatus and an inspection method. The object of the invention is to determine criterion function and in order to make the criterion function used for nonparametric 1-class discrimination form a single on-spec product region. In a discriminant function deciding section 20 in an inspection device, nondefective region discriminating section 26 determines, in an input space in which the discriminant function used for the nonparametric 1-class discrimination plots a sample, whether a region containing the sample discriminated into the class is formed as a single region. Then, when the region containing the sample discriminated into the class is not single, a parameter setting section 24 sets region parameters for defining the size of the region of the basis function of the base of a density function so that the discriminant function constitutes a single region in an input space in which the sample is plotted. Wherein, the region parameters prescribes criterion function and the region size of basis function as basic of criterion function.

Description

technical field [0001] The present invention relates to an inspection device and an inspection method for extracting feature quantities from input measurement data of an inspection object, and judging the state of the inspection object based on the extracted feature quantities. Background technique [0002] Rotary equipment incorporating drive system components such as electric motors is widely used in automobiles and home appliances. For example, in an automobile, rotating equipment is installed everywhere in the engine, power steering, power seat, transmission, and the like. In addition, among home electric appliances, rotary devices are installed in various products such as refrigerators, air conditioners, and washing machines. Then, when these rotary devices are in operation, sound is generated due to the rotation of the motor or the like. [0003] The sound caused by rotation includes the sound that must be produced with normal operation, and the sound that is caused ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01H17/00G01M19/00G01M99/00
Inventor 糀谷和人田崎博中宏伊藤星子
Owner ORMON CORP
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