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Liquid crystal panel inspection method and apparatus

A liquid crystal panel and inspection method technology, applied in the direction of measuring devices, optics, material analysis through optical means, etc., can solve the problem of dust reattachment, etc., and achieve the effect of improving the possibility

Inactive Publication Date: 2008-12-17
NIHON MICRONICS
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

According to Patent Document 2, the airflow dust removal method may cause dust to reattach

Method used

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  • Liquid crystal panel inspection method and apparatus
  • Liquid crystal panel inspection method and apparatus
  • Liquid crystal panel inspection method and apparatus

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Embodiment Construction

[0029] Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. FIG. 1 is a perspective view schematically showing an overall image of an embodiment of the liquid crystal panel inspection apparatus of the present invention. This inspection device is used to inspect defects of a liquid crystal panel in which a liquid crystal layer is interposed between a pair of transparent glass substrates. The liquid crystal panel to be inspected does not have a polarizer. This inspection device includes a first inspection unit 10, a second inspection unit 12, and a transport system provided between the two inspection units. Hereinafter, the operation of the liquid crystal panel 14 in this inspection device will be described. In the first inspection unit 10 , the liquid crystal panel 14 on which the first image is captured by the first imaging device 32 is transported to the first turntable 18 by a transport operation 16 . After the liqu...

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Abstract

The invention provides a liquid crystal panel detection method and the device thereof. When detecting the defect of the liquid crystal panel by a camera, a simple device can be used to distinguish the image of the dust attached on the liquid crystal panel and the image of the defect of the liquid crystal panel. A liquid crystal panel (14) arranged between a pair of transparent substrates is configured in a first detection part (10), and illumination light irradiates from one side of the liquid crystal panel (14), while taking a first image from the other side. The liquid crystal panel (14) is conveyed to a second detection part (12) from the first part (10). At the same time, the liquid crystal panel is inclined relative to at least one level surface in conveying process. The liquid crystal panel (14) is configured in a second detection part (12), and the dust on the inclined liquid crystal panel (14) is blown off by air. And the second image of the liquid crystal panel (14) is picked up by the second detection part (12). The bright spot of the first image in the dark display is compared with that of the second image so as to distinguish the defect of the liquid crystal panel and the dust on the liquid crystal panel.

Description

technical field [0001] The present invention relates to a liquid crystal panel inspection method and device of the type that irradiates a liquid crystal panel with back light and uses an imaging device to observe defects inside the liquid crystal panel. Background technique [0002] Currently, there is known a liquid crystal panel inspection device of the type that irradiates a liquid crystal panel with backlight and observes defects such as dust inside the liquid crystal panel using an imaging device. In such an inspection device, there is a problem in that the dust adhering to the surface of the liquid crystal panel is mistaken for an internal defect of the liquid crystal panel, and a good liquid crystal panel is judged as defective. It is known that Patent Document 1 and Patent Document 2 below disclose techniques for preventing the above-mentioned misidentification when inspecting components of a liquid crystal panel. [0003] Patent Document 1: Japanese Patent Applicat...

Claims

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Application Information

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IPC IPC(8): G02F1/13
CPCG01N21/896G02F1/1303G02F1/136254
Inventor 水野邦广菊田诚
Owner NIHON MICRONICS
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