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Method and arrangement for determining non-linear behavior

A non-linear, characteristic technique used in the field of determining the non-linear characteristics of a device under test, such as radio frequency or microwave equipment, and can solve problems such as inapplicability

Inactive Publication Date: 2009-02-11
NXP BV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In addition, the linearization of the transformation matrix elements ignores the inherent nonlinearity of the characteristics of the device under test and makes this approach unsuitable for accurate device characterization

Method used

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  • Method and arrangement for determining non-linear behavior
  • Method and arrangement for determining non-linear behavior
  • Method and arrangement for determining non-linear behavior

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Embodiment Construction

[0017] The preferred embodiment will be described below in connection with a four-sampler network analyzer.

[0018] figure 1 The apparatus required to determine or describe the nonlinear characteristics of RF and microwave devices according to a preferred embodiment is shown.

[0019] In the preferred embodiment, the relationship between the signal entering the device under test (DUT) 40 and the signal emanating from the DUT 40 is derived in terms of (generalized) S-parameters from Volterra's theory as expressed by the following equation:

[0020] b i = S ij a j

[0021] For linear properties, here a j represents at frequency f 1 and the incoming signal at port j, b i represents at frequency f 1 and the emit signal at port i, and:

[0022] b i = S ijk a j a k

[0023] For (second order) upconversion, here a k represents at frequency f 2 The incoming signal at and at port k, a j represents at frequency f 1 and the incoming signal at port j, b i Represents th...

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Abstract

The present invention relates to a method of and arrangement for determining non-linear behavior of a device (40) under test, wherein the device (40) is excited by a test signal on relevant device terminals under different termination conditions and the emitted signals at the fundamental and harmonic frequencies are measured at the relevant device terminals. Then, calibration measurements taken on calibration standards of known impedance and linearity are performed to derive parameters needed to correct the raw data read by the measurement for cable loss and delay and for non-linear behavior of the measurement system. Finally, non-linear scattering or admittance parameters are extracted from the error corrected measurements taken at different excitation and termination conditions. Thereby, the non-linear behavior can be more accurately characterized, modeled and understood.

Description

technical field [0001] The present invention relates to methods and apparatus for determining nonlinear characteristics of equipment under test, such as radio frequency (RF) or microwave equipment. Background technique [0002] Telecommunications or other RF or microwave devices have been widely used by the public. These devices include such RF or microwave components as mixers, low noise amplifiers, power amplifiers and the like. The design of such components is very problematic and requires several design iterations, mainly due to the limited accuracy of the RF models used, especially with regard to the description of their nonlinear behavior. [0003] Traditional models are based on small signal measurements. Scattering (S) and admittance (Y) parameters have been shown to characterize linear networks with the same input and output frequencies. However, if such models are used in nonlinear (large-signal) operation, they would not always be expected to describe the hard ...

Claims

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Application Information

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IPC IPC(8): G01R27/28
CPCG01R27/28
Inventor 卢卡斯·F·蒂迈吉尔
Owner NXP BV
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