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Test control method

A test control and product technology, applied in electrical components and other directions, can solve the problems that users are difficult to discover audio products in time, cannot obtain the bad distribution and yield of audio products, and cannot realize audio product monitoring, etc., to achieve the effect of convenient monitoring.

Active Publication Date: 2012-10-17
亦宸五金(浙江)股份有限公司
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Problems solved by technology

However, the existing audio product test control methods cannot obtain the bad distribution and yield of audio products
This makes it difficult for users to discover abnormalities in audio products during the manufacturing process and testing process in a timely manner and to further find out the reasons for the abnormalities
In this way, it is impossible to monitor the manufacturing process and testing process of audio products

Method used

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Embodiment Construction

[0019] The present invention will be further described in detail below through specific embodiments and in conjunction with the accompanying drawings.

[0020] like figure 1 Shown, a kind of test control method of audio product, comprises the following steps:

[0021] Step 1: The test control center configures a memory, which includes at least two storage units, and the storage units correspond to at least two test sub-items of the audio products on each station. The storage unit is a matrix storage method, and in this embodiment, the row elements of the matrix are workstations, and the column elements are test subitems. Obviously, the row elements of the matrix can also be test sub-items, and the column elements can be workstations. The test sub-items include microphone test, loudspeaker test and other sub-items, and there is at least one of the stations.

[0022] Step 2: The test control center tests each test sub-item of the audio product on each station respectively, an...

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Abstract

The invention discloses a test control method which comprises the following steps: a test control center is equipped with a memory which comprises at least two memory cells, and the memory cells are corresponding to at least two test sub-items of a product on each working position in an one-to-one manner; the test control center respectively tests various sub-items of the product on each working position, and counts the number of the disqualified test sub-items on each working position in the corresponding memory cells; and the test control center obtains the disqualified distribution of the various test sub-items of the product on each working position according to a storage result of the memory. By adopting the method, a user can timely discover the abnormal conditions of the product ina manufacturing process and in a test process, and further finds out the reason for the abnormal conditions; and the method is convenient for the user to monitor the manufacturing process and the test process of the product.

Description

technical field [0001] The invention relates to a test control method. Background technique [0002] When testing audio products, it is generally necessary to test the microphone, speaker and other sub-items of the audio product separately, and judge whether the audio product is qualified according to the test results of these sub-items. Sometimes, in order to improve production efficiency, multiple stations are also set up at the same time, and each sub-item of the audio product is tested on each station. However, the existing testing and control methods for audio products cannot obtain the bad distribution and yield of audio products. This makes it difficult for users to timely discover abnormalities in the audio product manufacturing process and testing process and further find out the reasons for the abnormalities. In this way, the monitoring of the manufacturing process and testing process of the audio product cannot be realized. Contents of the invention [0003] ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04R29/00
Inventor 易松林
Owner 亦宸五金(浙江)股份有限公司
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