Film processing device
A thin film processing and equipment technology, applied in the field of thin film processing equipment, can solve the problems of uneven deposition and etching films, degradation of film uniformity, etc.
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- Publication Date
- 2009-05-27
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
[0001] This application claims the benefit of Korean Patent Application No. 10-2007-0118820 filed in Korea on Nov. 20, 2007, which is incorporated herein by reference. technical field
[0002] The invention relates to a thin film processing device. Background technique
[0003] Liquid crystal display devices, semiconductor devices (for example, solar cells), and the like are manufactured through various substrate-specific processes. For example, a thin film deposition process and a photolithography process and an etching process are performed several times to form a circuit pattern on the substrate, and additional processes such as a cleaning process, an attaching process, a cutting process, etc. are performed.
[0004] The deposition process and the etching process are performed in chamber type thin film processing equipment. Recently, PECVD (Plasma Enhanced Chemical Vapor Deposition) equipment in which a reactive gas is excited in plasma using RF (Radio Frequency) high vo...
Examples
Embodiment Construction
[0038] Reference will now be made in detail to the illustrated embodiments of the invention, which are illustrated in the accompanying drawings.
[0039] image 3 is a cross-sectional view illustrating a thin film processing apparatus according to a first embodiment of the present invention, and Figure 4 is to zoom in image 3 A view of area B.
[0040] see image 3 and 4 , the thin film processing apparatus according to the first embodiment includes a chamber 110 .
[0041] The reaction space A is in the processing chamber 110 and is a sealed space for performing a thin film processing process. The reaction space A is between the upper electrode 134 and the lower electrode 160 . The upper electrode 134 may be supplied with an RF high voltage, and the lower electrode 160 may be supplied with a bias voltage. The lower electrode 160 may serve as a chuck or a substrate replacement portion on which the substrate 102 is placed, and moves up and down.
[0042]Gas distributi...