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Method for diagnosing and correcting substrate offset and device for diagnosing and correcting

A correction method and substrate technology, applied in the field of microelectronics, can solve the problems of high implementation cost, microprocessing chips and electronic components are not suitable for high temperature and vacuum environment, a large number of complex image processing algorithms, etc. Sheet damage and production loss, the effect of improving accuracy

Active Publication Date: 2011-12-07
安徽尚特杰企业管理有限公司
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Problems solved by technology

The disadvantage is that some fine micro-processing chips and electronic components required by the system are not suitable for high temperature and vacuum environments, and the visual inspection method requires a large number of complex image processing algorithms, and the implementation cost is also high

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  • Method for diagnosing and correcting substrate offset and device for diagnosing and correcting
  • Method for diagnosing and correcting substrate offset and device for diagnosing and correcting
  • Method for diagnosing and correcting substrate offset and device for diagnosing and correcting

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Embodiment 1

[0035] Such as figure 1 As shown, the substrate offset diagnosis and correction device of the present invention includes a diagnosis unit and a correction unit.

[0036] Such as figure 1 , 2 As shown, the diagnostic unit includes a first sensor 1, and the first sensor 1 is placed on the tangent line of the outer circumference of the substrate when the center 6 of the substrate coincides with the center 4 of the manipulator finger, wherein the tangent line is a tangent line parallel to the Y axis. In this embodiment, the first sensor 1 adopts a photoelectric sensor, including a light emitting device and a light receiving device, and the light emitting device and the light receiving device are respectively arranged above and above the plane where the substrate is located at a distance from the tangent position. below.

[0037] In fact, the above diagnostic unit alone can constitute a substrate offset diagnostic device.

[0038] Such as figure 1 , 3 As shown, the calibratio...

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PUM

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Abstract

The invention discloses a method for diagnosing and correcting substrate offset, which includes the following steps: 10) Diagnosing step: judging whether the substrate carried by the conveying part is offset based on the detection result of the first sensor, if there is no offset , then do not perform the following correction steps; if there is an offset, then transfer to the following correction step; 20) Calibration step: adjust the position of the substrate to eliminate the offset and return to the reference position. In addition, the present invention also provides a device for diagnosing and correcting substrate deviation, including a diagnosis unit and a correction unit, wherein the diagnosis unit is used to judge whether the substrate carried by the conveying component is deviated, and if there is a deviation, then The calibration unit is triggered to work; if there is no offset, no operation is performed; the calibration unit is used to adjust the position of the substrate so that it can eliminate the offset and return to the reference position. The method and device provided by the invention are simple and easy to implement, and can accurately transfer substrates with high transfer accuracy and good reliability.

Description

technical field [0001] The present invention relates to the technical field of microelectronics, in particular to a method for diagnosing and correcting substrate offset, and also relates to a device for diagnosing and correcting substrate offset. Background technique [0002] In modern semiconductor substrate transfer, the central transfer chamber is surrounded by multiple process reaction chambers as the mainstream system architecture. The central transfer chamber is equipped with a vacuum robot to load and unload substrates for each reaction chamber surrounding the transfer chamber. piece. Processes including etching, physical and chemical vapor deposition, ion implantation, and photolithography can be performed in these reaction chambers. [0003] As feature sizes decrease and substrate sizes increase, the accuracy of substrate target position transfer around each reaction chamber becomes extremely important. High repeatability and accuracy of substrate transfer can en...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/68H01L21/66
Inventor 李永军
Owner 安徽尚特杰企业管理有限公司
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