Measuring method of technical parameters of delay-type audio devices of electrophone

A technology of technical parameters and measurement methods, applied in electro-acoustic musical instruments, measurement devices, measurement of reverberation time, etc., can solve problems such as inaccurate and non-quantitative test methods, and achieve the effect of simple operation

Inactive Publication Date: 2011-09-14
武汉艾立卡电子有限公司
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Problems solved by technology

Scanning depth and scanning rate are the technical parameters of time-delay sound effect devices. The quality of sound effect devices can be determined through technical parameters. At present, judging the quality of sound effect devices mainly depends on the subjective judgment method of musicians listening with ears, and there is no quantitative method. The test method is not accurate enough

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  • Measuring method of technical parameters of delay-type audio devices of electrophone
  • Measuring method of technical parameters of delay-type audio devices of electrophone
  • Measuring method of technical parameters of delay-type audio devices of electrophone

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Embodiment Construction

[0021] figure 1 It is the basic model of chorus and flanger effects. Chorus and flanger use a low-frequency oscillator (LFO) to generate low-frequency waves such as sine waves, triangle waves, and sawtooth waves to modulate. It is determined by a constant and is usually called Initial Delay (Initial Delay) The fixed time delay makes the total delay time (Total Delay) fluctuate between the maximum value and the minimum value under the fluctuation amplitude of the modulating wave. The range of fluctuation is called the scan depth. The speed of the seed wave is called the scan rate, such as figure 2 shown.

[0022] Figure 4 It is the device connection diagram of the embodiment of the present invention. During the measurement, the feedback control value of the sound effect device under test is turned off or adjusted to the minimum value, and the other control values ​​are adjusted to the rated value. If there are other temporary unexpected effects, it should be closed. An exc...

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Abstract

The invention provides a measuring method of technical parameters of delay-type audio devices of an electrophone. In the method, the characteristics of a digital oscilloscope are utilized to measure parameters of total delay generated by various types of low-frequency wave audio devices generated by utilizing an actuating signal source and the waves generated by the actuating signal source, and to determine the technical parameters of scanning depth, scanning speed and the like. The invention can be used for objectively measuring the values of the technical parameters, breaks through methodswhich only can carry out subjective judgment in the field, provides a corresponding standard and has simple operation, rapidness and accuracy.

Description

technical field [0001] The invention relates to a method for measuring technical parameters of a time-delay sound effect device of an electric musical instrument. Background technique [0002] The chorus and flanger sound effects in the delay sound device use a low-frequency oscillator (LFO) to generate low-frequency waves such as sine waves, triangle waves, and sawtooth waves to modulate a value determined by a constant, which is usually called the initial delay (Initial Delay). Fixed time delay, so that the total delay time (Total Delay) fluctuates between the maximum value and the minimum value under the fluctuation amplitude of the modulation wave. The range of fluctuation is called the scan depth. Various low-frequency oscillators (LFO) generate The velocity of the waves is called the scan rate. Scanning depth and scanning rate are the technical parameters of time-delay sound effect devices. The quality of sound effect devices can be determined through technical parame...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01H7/00G10H1/10
Inventor 张鉴堂庄严田海燕王学义
Owner 武汉艾立卡电子有限公司
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