A clinical measurement method of scalp surface area in skull defect area

A measurement method and surface area technology, which is applied in the field of medical measurement, can solve problems such as needs, unevenness of the scalp, and strong subjectivity, and achieve the effects of convenient operation, rapid measurement, and low cost

Inactive Publication Date: 2018-10-12
YUNNAN UNIV
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Problems solved by technology

The above method has the following disadvantages: 1. The visual method is related to the experience of medical personnel, is highly subjective, and has errors
2. Indirect measurement of CT images is expensive and requires professional operation, which is not convenient for rapid clinical measurement
However, the unevenness of the scalp in the skull defect area still makes the current common methods unable to fully meet the requirements of accurate, objective, convenient, long-term, repeated, and rapid clinical measurement of the scalp surface area in the skull defect area.
[0003] Through literature search, do not find the public report identical with the technical scheme of the present invention

Method used

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Embodiment Construction

[0011] The clinical measurement method of skull defect region scalp surface area of ​​the present invention, its concrete steps are as follows:

[0012] 1. Cover the scalp surface of the skull defect area of ​​the object to be detected with an irreversible discoloration inelastic ultra-thin flexible material with grid ultraviolet light sensitivity, and depict the edge of the skull defect area;

[0013] 2. Use an irradiation intensity of 80 μw / cm at a place 1.0 meters away from the scalp surface of the skull defect area 2 UV light for 20s;

[0014] 3. Count the number of color-changing grids (manually count the number of color-changing grids or the number of video machine automatic recognition of color-changing grids) according to the conventional method to calculate the scalp surface area of ​​the skull defect area.

[0015] The devices used in the present invention are purchased from the market.

[0016] The practical application shows that the present invention not only ha...

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Abstract

The invention relates to a clinical measurement method for a skull defect area scalp superficial area, and belongs to the technical field of medical measurement. The clinical measurement method for the skull defect area scalp superficial area comprises the specific steps that 1, an ultraviolet light irretrievable color inelastic ultra-thin soft material with grids covers the skull defect area scalp surface of an object needing detecting, and the edge of a skull defect area is described; 2, an ultraviolet radiator with the irradiation strength of 80 mu w / cm<2> is used for irradiating the position 1.0 m away from the skull defect area scalp surface for 20 seconds; 3, the number of the allochroic grids is counted and the skull defect area scalp superficial area is computed according to a conventional method. The devices used in the method are purchased on the market. The clinical measurement method for the skull defect area scalp superficial area has the advantages of being low in cost, convenient to operate, and capable of accurately, objectively and rapidly carrying out clinical measurement on the skull defect area scalp superficial area.

Description

Technical field: [0001] The invention relates to a clinical measurement method for the scalp surface area of ​​a skull defect area, belonging to the technical field of medical measurement. Background technique: [0002] The clinical measurement of the scalp surface area in the skull defect area is of great significance to the determination of the disease progression and follow-up treatment plan of patients with craniocerebral diseases after bone flap repair. At present, the clinical measurement of the scalp surface area in the skull defect area mostly adopts the method of visual inspection or indirect measurement of CT images. The above method has the following disadvantages: 1. The visual inspection method is related to the experience of medical personnel, is highly subjective and has errors. 2. The indirect measurement of CT images is expensive and requires professionals to operate, which is not convenient for rapid clinical measurement. At present, the measurement of th...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): A61B5/107
Inventor 李宝磊赵磊安镇宙刘亚杰张榆锋施心陵
Owner YUNNAN UNIV
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