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Test system and method of peripheral component interconnection rapid slot

A technology for interconnecting peripheral components and testing systems, applied in error detection/correction, instruments, electrical digital data processing, etc., can solve time-consuming and inconvenient problems

Inactive Publication Date: 2010-12-22
INVENTEC CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Such a testing process is very time-consuming and inconvenient

Method used

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  • Test system and method of peripheral component interconnection rapid slot
  • Test system and method of peripheral component interconnection rapid slot
  • Test system and method of peripheral component interconnection rapid slot

Examples

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Embodiment Construction

[0020] Please refer to figure 1 , is a block diagram of a test system 10 for a peripheral component interconnect express socket according to an embodiment of the present invention. The testing system 10 includes: a peripheral component interconnection quick pin interface 100 , a peripheral component interconnection quick slot interface 102 , a processing module 104 , a data transmission module 106 and a power supply module 108 . The peripheral component interconnection quick pin interface 100 is used for connecting the motherboard 12 , and the peripheral component interconnection quick socket interface 102 is used for connecting the board under test 14 . It should be noted that the motherboard 12 substantially also includes the peripheral component interconnection quick slot interface 120 of the motherboard, and the board under test 14 also includes the peripheral component interconnection quick pin interface 140 of the board under test. Therefore, the peripheral component in...

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Abstract

The invention discloses test system and method of a peripheral component interconnection rapid slot. The test system comprises a peripheral component interconnection rapid pin interface, a peripheral component interconnection rapid slot interface, a processing module, a data transmission module and a power module, wherein the peripheral component interconnection rapid pin interface is used for connecting with a mainboard; the peripheral component interconnection rapid slot interface is used for connecting with a board to be tested; the processing module is used for carrying out a mainboard test program through the peripheral component interconnection rapid pin interface; the data transmission module is used for switching different data transmission modes, providing a data transmission mode corresponding to the mainboard according to the mainboard test program and further carrying out a test program of the board to be tested between the mainboard and the board to be tested; and the power module is used for supplying or cutting off a power supply of the board to be tested so as to provide the hot plug action.

Description

technical field [0001] The present invention relates to a testing system for a peripheral component interconnect express, and in particular to a testing system and a testing method for a peripheral component interconnect express. Background technique [0002] Peripheral component interconnection fast interface is a widely used computer data transmission interface. Common motherboards in the market are often provided with such interfaces for data transmission. However, in the test of the fast interface for interconnecting peripheral components, the manufacturer needs to test the main board and the function card with the fast interface for interconnecting peripheral components, such as a network card, a display card or a sound card, respectively, and cannot test the main board and the fast interface of the peripheral component at the same time. The function card is tested in both directions. Moreover, when the function card is tested, if the function card is to be replaced, ...

Claims

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Application Information

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IPC IPC(8): G06F11/267
Inventor 金志仁朱俊豪王定宏蔡圣源
Owner INVENTEC CORP
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