Thickness identification device of slice-type medium and identification method thereof
A thin-film medium and thickness identification technology, which is applied to measuring devices, optical devices, and banknote authenticity inspection, etc., can solve the problems of unequal radii, non-smooth detection contact surface, and non-smooth detection roller detection contact surface, etc.  Achieve the effect of enhancing robustness, reducing measurement error and improving discrimination accuracy
- Summary
- Abstract
- Description
- Claims
- Application Information
 AI Technical Summary 
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0041] The device and method for discriminating the thickness of a sheet medium provided by the present invention will be described in detail below with reference to the drawings.
[0042] see image 3 and Figure 4 , the structure diagram and the thickness measurement module structure diagram of the sheet medium thickness identification device provided by the present invention, the sheet medium thickness identification device 10 includes a thickness measurement module 11, a data storage module 12, a data correction module 13 and an identification module 14. The thickness measurement module 11 is used to collect the thickness measurement information of the sheet-like medium, and includes a reference roller 112 mounted on the driving shaft 111, a driven detection roller 114 mounted on the floating driven shaft 113, and a collection roller 114. The sensor 115 that drives the displacement data of the detection roller 114; the data storage module 12 is used to store the standard...
PUM
 Login to View More
 Login to View More Abstract
Description
Claims
Application Information
 Login to View More
 Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com



