Method for testing radio frequency parameters of four-port radio frequency device

Abstract

The invention discloses a method for testing radio frequency parameters of a four-port radio frequency device. In the method, the domain structure of the four-port radio frequency device is designed; any two radio frequency ports are grounded; and the other two ports of the domain structure of the special four-port radio frequency device serves as two ports to be subjected to radio frequency test for testing the two ports to obtain the radio frequency S parameters of the two ports; and based on the radio frequency S parameters obtained by testing the two ports, the radio frequency S parameters of a four-port radio frequency device are derived. The method for testing the radio frequency parameters of the four-port radio frequency device has the advantage of low cost, and is simple and convenient.

Description

technical field [0001] The invention relates to semiconductor testing technology, in particular to a method for testing radio frequency parameters of a four-port radio frequency device. Background technique [0002] In the modeling process of active radio frequency devices, it is necessary to obtain multi-port radio frequency parameters (such as scattering parameters S parameters of radio frequency devices, etc.). For example for figure 1 For radio frequency devices such as an on-chip (transformer) shown, radio frequency modeling requires radio frequency parameters related to the four ports of the primary and secondary stages of the on-chip transformer. In order to obtain accurate RF parameters of four-port RF devices, the traditional method is to use four-port RF test equipment to test the RF parameters of four-port RF devices. This method not only requires the purchase of expensive four-port RF test equipment, but greatly improves In addition, it is necessary to design a...

AI Technical Summary

Problems solved by technology

In order to obtain accurate RF parameters of four-port RF devices, the traditional method is to use four-port RF test equipment to test the RF parameters of four-port RF devices. This method not only requires the purchase of expensive four-port RF test equipment, but greatly improves The cost of modeling, but also need to design a special four-port RF test layout structure (for example, a specific port grounding) to meet the test conditions of four-port test equipment, increasing the design difficulty of four-port RF device RF test layout

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