Stimulating module for testing universal performance of serial interface

A technology of serial interface and test stimulus, applied in the direction of digital transmission system, electrical components, transmission system, etc.

Inactive Publication Date: 2011-06-08
CHINESE AERONAUTICAL RADIO ELECTRONICS RES INST
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Problems solved by technology

[0006] The present invention aims at the problem that the existing serial communication test module can only perform functional tests of products, and only provides a fixed baud rate and the baud rate cannot be fine-tuned, and provides a serial

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  • Stimulating module for testing universal performance of serial interface
  • Stimulating module for testing universal performance of serial interface
  • Stimulating module for testing universal performance of serial interface

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Embodiment Construction

[0036] In order to make the technical means, creative features, goals and effects achieved by the present invention easy to understand, the present invention will be further described below in conjunction with specific illustrations.

[0037] see figure 1 , the serial interface universal performance test excitation module provided by the present invention is based on SOC technology, which includes a SOC chip 100, a common-mode signal generation module 200, a differential-mode signal generation and amplitude control module 300, a differential-mode signal and common-mode signal superposition module 400 And the serial port protocol chip 500.

[0038] Among them, the SOC chip provides the signal source for forming the serial communication signal, and controls the occurrence of the baud rate at the same time. The SOC chip uses a 16-bit counter or timer that is automatically reloaded in the SOC as a generator of the baud rate. In order to improve the accuracy of the baud rate, a p...

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Abstract

The invention discloses a stimulating module for testing the universal performance of a serial interface. A system on chip (SOC) is used for controlling the generation of a Baud rate and providing a signal source for forming a serial communication signal; a common-mode signal generating module is used for converting two paths of digital to analogue (D/A) output signals on the SOC to generate a common-mode signal; a different-mode signal generating and amplitude controlling module is used for converting a single-ended signal output by an SOC serial port into a different-mode signal and controlling the amplitude of the different-mode signal; a different-mode signal and common-mode signal superposition module is used for superposing the common-mode signal and the different-mode signal generated by the common-mode signal generating module and the different-mode signal generating and amplitude controlling module so as to obtain an amplitude-adjustable serial communication signal; and a serial protocol chip is used for receiving a corresponding signal for the SOC. The simulating module is SOC technology-based and consists of circuits, such as the SOC, a gate circuit, an operational amplifier, a digitally controlled potentiometer and the like, and programming and offset adjustment, programming of signal amplitude and programming of word format can be realized.

Description

technical field [0001] This patent relates to the serial pass-through testing technology of electronic equipment, especially the technology of providing incentives for serial communication performance testing. Background technique [0002] At present, the existing serial communication test modules, whether they are commercial modules or self-developed modules, can only perform functional tests of products, but cannot perform performance tests. The basic items of performance testing include: electrical performance testing and format testing of words and information. [0003] In the existing communication test module, the serial communication hardware interface adopts a communication protocol chip, and the amplitude of the output serial signal (the excitation signal that can be provided) is 2v-6v, and the amplitude is not adjustable. The minimum amplitude of the excitation signal required by the performance test is 200mv, and the amplitude can be fine-tuned in steps of 10mv. ...

Claims

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Application Information

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IPC IPC(8): H04L12/26
Inventor 胡淑环候长明张界德
Owner CHINESE AERONAUTICAL RADIO ELECTRONICS RES INST
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