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A sorting structure of integrated circuit testing and sorting machine

A technology for testing sorting machines and integrated circuits, applied in sorting and other directions, can solve problems such as high cost and short service life, and achieve the effects of eliminating shaking, facilitating maintenance and replacement, and reducing use costs.

Active Publication Date: 2011-11-30
HANGZHOU CHANGCHUAN TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, there are many kinds of sorting machines used in the testing and packaging of integrated circuits. Most of the sorting mechanisms use the method of directly connecting the air claw cylinder with the gear lever, and the structure made of this air claw cylinder has the disadvantages of high cost and short service life. shortcoming

Method used

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  • A sorting structure of integrated circuit testing and sorting machine
  • A sorting structure of integrated circuit testing and sorting machine

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0015] When the cylinder block 11 is working and the cylinder shaft 10 is jacked up, the front shift lever 4 is supported by the shift lever pin 5A as a fulcrum, and the part of the shift lever pin 5A side biased to the cylinder block 11 will be tilted with the cylinder shaft 10. The part of the other side of the gear lever pin 5A that is partial to the particle briquetting block 1 will descend to realize the function of the second-to-last grain; at the same time, the warping of the front gear lever 4 side will drive the warping of the optical axis 13 positioned above. Since the gear lever pin 5B as a fulcrum on the rear gear lever 12 is located on the rear support 8 at the tail, the optical axis 13 will move in the through groove 14 on the rear gear lever 12, and drive the rear gear lever 12 around the gear lever The pin 5B is tilted up to realize the function of putting the last material; similarly, when the cylinder shaft 10 is retracted downward, the front gear lever 4 is s...

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PUM

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Abstract

The invention discloses a grain sorting mechanism of an integrated circuit test handler. The mechanism at least comprises a circuit flow channel, an air cylinder, a front retaining rod and a rear retaining rod, wherein the front retaining rod and the rear retaining rod act on the circuit flow channel and the air cylinder; the front retaining rod is connected with an L-shaped connecting piece which is fixed on an air cylinder shaft by a screw; the air cylinder shaft is arranged in the cylinder body of the air cylinder; the front retaining rod and the rear retaining rod are provided with a front support and a rear support; an optical axis and an optical axis groove are formed between the front retaining rod and the rear retaining rod; and the front retaining rod is provided with a threaded hole through which a grain sorting pressure block can be fixed on the front retaining rod by a screw. The grain sorting mechanism is driven by a translation air cylinder, so the use cost is reduced effectively.

Description

technical field [0001] The invention relates to an integrated circuit testing and sorting machine, in particular to a sorting mechanism of the integrated circuit testing and sorting machine. Background technique [0002] At present, there are many kinds of sorting machines used in the testing and packaging of integrated circuits. Most of the sorting mechanisms use the method of directly connecting the air claw cylinder with the gear lever, and the structure made of this air claw cylinder has the disadvantages of high cost and short service life. shortcoming. Contents of the invention [0003] The object of the present invention is to overcome the above-mentioned shortcomings, and provide a sorting mechanism of an integrated circuit testing and sorting machine with a simple structure and a long service life. [0004] The object of the present invention is accomplished through the following technical scheme, a grading mechanism of an integrated circuit test sorter, which at...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/36
Inventor 韩笑
Owner HANGZHOU CHANGCHUAN TECH CO LTD
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