Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Wheatstone bridge compensation resistance test method

A technology for compensating resistance and testing methods, applied in the direction of measuring resistance/reactance/impedance, measuring device, measuring electrical variables, etc. development effect

Active Publication Date: 2012-03-07
EAST CHINA INST OF OPTOELECTRONICS INTEGRATEDDEVICE
View PDF2 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to solve the problem that the traditional measurement method has poor accuracy and is difficult to adapt to the mass production test, and provides a fast and accurate test method for measuring the compensation resistance of the Wheatstone bridge

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Wheatstone bridge compensation resistance test method
  • Wheatstone bridge compensation resistance test method
  • Wheatstone bridge compensation resistance test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014] A kind of testing method of Wheatstone bridge compensation resistance provided by the invention, such as figure 2 Shown:

[0015] 1. Connect an ammeter between node 2 and node 4, namely figure 2 The middle switch S1 is closed and the remaining switches are all disconnected, and the value measured by the ammeter is I 1 ,Depend on figure 2 It can be seen that R1= ;

[0016] 2. Connect an ammeter between node 1 and node 2, namely figure 2 The middle switch S2 is closed and the remaining switches are all disconnected, and the value measured by the ammeter is I 2 ,Depend on figure 2 It can be seen that R2= ;

[0017] 3. Connect an ammeter between node 1 and node 5, namely figure 2 The middle switch S3 is closed and the remaining switches are all disconnected, and the value measured by the ammeter is I 3 ,Depend on figure 2 It can be seen that R3= ;

[0018] 4. Connect an ammeter between node 4 and node 5, namely figure 2 The middle switch S4 is close...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a Wheatstone bridge compensation resistance test method which comprises the following steps: a. connecting a parallel branch formed by an ammeter and a switch at two ends of each bridge arm resistor of a Wheatstone bridge respectively; b. at each time, connecting only one ammeter to work, measuring corresponding current I1, I2, I3, and I4 of bridge arm resistors respectively, and utilizing a formula R=I4*Vcc / I1*I3-I2*I4 or R=I1*Vcc / I2*I4-I1*I3 to calculate a resistance value of R. Compared with the prior art, the Wheatstone bridge compensation resistance test method has the advantages that: through an electrical test circuit and mathematical formula transformation, a resistance value needs to be compensated at a bridge arm can be accurately calculated, a programmable value of a calculating method is high, the method is easy to be developed on a test system, a large scale test of on-line production is realized, and a problem is solved with high efficiency.

Description

Technical field: [0001] The invention relates to the field of electronic circuit testing, in particular to a testing method for compensation resistance of a Wheatstone bridge. Background technique: [0002] In many electronic products such as integrated circuits and sensors, a circuit called a Wheatstone bridge is often used. figure 1 , figure 1 In the case where the resistance values ​​of the four resistors are exactly the same, the voltage Vout between node 2 and node 5 is 0. However, in actual use, due to the influence of process conditions and other factors, the resistance values ​​​​of the four resistors will be different, resulting in Vout≠0. At this time, a resistor R can be connected in parallel on the bridge arm end of the Wheatstone bridge, that is, R2 or R3. Vout=0. The existing technical means is to manually adjust the parallel resistance R so that Vout=0, and then test the value of R, which is the compensation resistance value. This method is not accurate en...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R27/00
Inventor 郑宇方岚焦贵忠徐春叶欧阳径桥明源田波
Owner EAST CHINA INST OF OPTOELECTRONICS INTEGRATEDDEVICE
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com