Wheatstone bridge compensation resistance test method

A technology for compensating resistance and testing methods, applied in the direction of measuring resistance/reactance/impedance, measuring device, measuring electrical variables, etc. development effect

Active Publication Date: 2012-03-07
EAST CHINA INST OF OPTOELECTRONICS INTEGRATEDDEVICE
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

[0003] The purpose of the present invention is to solve the problem that the traditional measurement method has poor accuracy and is difficult to

Method used

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  • Wheatstone bridge compensation resistance test method

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Embodiment Construction

[0014] A kind of testing method of Wheatstone bridge compensation resistance provided by the invention, such as figure 2 Shown:

[0015] 1. Connect an ammeter between node 2 and node 4, namely figure 2 The middle switch S1 is closed and the remaining switches are all disconnected, and the value measured by the ammeter is I 1 ,Depend on figure 2 It can be seen that R1= ;

[0016] 2. Connect an ammeter between node 1 and node 2, namely figure 2 The middle switch S2 is closed and the remaining switches are all disconnected, and the value measured by the ammeter is I 2 ,Depend on figure 2 It can be seen that R2= ;

[0017] 3. Connect an ammeter between node 1 and node 5, namely figure 2 The middle switch S3 is closed and the remaining switches are all disconnected, and the value measured by the ammeter is I 3 ,Depend on figure 2 It can be seen that R3= ;

[0018] 4. Connect an ammeter between node 4 and node 5, namely figure 2 The middle switch S4 is close...

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Abstract

The invention relates to a Wheatstone bridge compensation resistance test method which comprises the following steps: a. connecting a parallel branch formed by an ammeter and a switch at two ends of each bridge arm resistor of a Wheatstone bridge respectively; b. at each time, connecting only one ammeter to work, measuring corresponding current I1, I2, I3, and I4 of bridge arm resistors respectively, and utilizing a formula R=I4*Vcc/I1*I3-I2*I4 or R=I1*Vcc/I2*I4-I1*I3 to calculate a resistance value of R. Compared with the prior art, the Wheatstone bridge compensation resistance test method has the advantages that: through an electrical test circuit and mathematical formula transformation, a resistance value needs to be compensated at a bridge arm can be accurately calculated, a programmable value of a calculating method is high, the method is easy to be developed on a test system, a large scale test of on-line production is realized, and a problem is solved with high efficiency.

Description

Technical field: [0001] The invention relates to the field of electronic circuit testing, in particular to a testing method for compensation resistance of a Wheatstone bridge. Background technique: [0002] In many electronic products such as integrated circuits and sensors, a circuit called a Wheatstone bridge is often used. figure 1 , figure 1 In the case where the resistance values ​​of the four resistors are exactly the same, the voltage Vout between node 2 and node 5 is 0. However, in actual use, due to the influence of process conditions and other factors, the resistance values ​​​​of the four resistors will be different, resulting in Vout≠0. At this time, a resistor R can be connected in parallel on the bridge arm end of the Wheatstone bridge, that is, R2 or R3. Vout=0. The existing technical means is to manually adjust the parallel resistance R so that Vout=0, and then test the value of R, which is the compensation resistance value. This method is not accurate en...

Claims

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Application Information

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IPC IPC(8): G01R27/00
Inventor 郑宇方岚焦贵忠徐春叶欧阳径桥明源田波
Owner EAST CHINA INST OF OPTOELECTRONICS INTEGRATEDDEVICE
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