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Disk I/O (Input/Output) test system oriented to embedded system

An embedded system and test system technology, applied in the field of information storage, can solve problems such as hindering widespread application, not being able to understand the operation of embedded systems in a timely manner, and making it difficult for third parties to customize products, so as to achieve the effect of maintaining system security

Active Publication Date: 2014-02-12
SOUTH CHINA UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although VxWorks, as a real-time operating system, has great advantages in national defense and industry, its high cost and relatively limited technical support hinder its wide application to a certain extent; Windows CE has a good development and debugging environment and friendly Graphical user interface has a certain market in the embedded field, but Windows CE is a non-open OS, and it is difficult for third parties to realize product customization, and copyright fees are also issues that manufacturers have to consider; on the contrary, for embedded Linux , its free, open source, strong open source community support, customizability, cross-platform, tailorable, robust and stable features make it occupy a large proportion in embedded operating systems
However, in the embedded field, the high update speed of the embedded system makes the system upgrade more frequent, and at the same time, the requirements for disk I / O are also increased. I / O and System Suitability Test

Method used

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  • Disk I/O (Input/Output) test system oriented to embedded system
  • Disk I/O (Input/Output) test system oriented to embedded system
  • Disk I/O (Input/Output) test system oriented to embedded system

Examples

Experimental program
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Embodiment 1

[0020] Such as figure 1 As shown, a disk I / O test system for embedded systems includes a client, a target machine, and the client is connected to the network of the target machine. The client includes: a transmission control module for receiving a display switching module test instructions and forward the test instructions to the test agent module on the target machine side, and forward the test data returned by the test agent module to the data processing module; the data processing module is used to process the received test data and process the processed test data output to the display exchange module; the display exchange module is used to display the received test data, and accepts the user's test instruction input and forwards the test instruction to the transmission control module; the database module is used to store the test data; the target machine includes : The test agent module is used to receive test instructions and send the test instructions to the test executi...

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Abstract

The invention discloses a disk I / O (Input / Output) test system oriented to an embedded system. The disk I / O test system comprises a client side and a target machine side, wherein the client side is in network connection with the target machine side. The client side comprises a transmission control module, a data processing module and a display switching module; and the target machine side comprises a test agent module and a test execution module. The disk I / O test system has the beneficial effects of testing the I / O performance of an embedded disk in special systems, monitoring the disk I / O of the system in real time and analyzing whether a bottle neck exists in the I / O, monitoring the I / O condition of processes in real time and obtaining the disk I / O access condition of the software running in the system in real time, tracking and recording each disk I / O access, and storing the records in a database. On one hand, a drive layer monitors the disk I / O; and on the other hand, the collected daily reading and writing data can be used as an input source in the disk test so as to simulate the practical application, and finally, true and reliable performance assessment on the tested disk is obtained.

Description

technical field [0001] The invention relates to the technical field of information storage, in particular to a disk I / O test system for embedded systems. Background technique [0002] With the rapid development of the information age in which computer technology and communication technology are combined, the integration trend of 3C (namely, computer, communication, and consumer electronics) is becoming more and more obvious. Embedded system has become an ideal carrier of 3c integration by virtue of its own characteristics, so the research and development of embedded system has become a hot spot at present. The information age has higher and higher requirements on the memory performance and capacity of the embedded system, unlike the early embedded systems that have no external memory or only simple external storage devices. Disks have been gradually introduced into embedded systems. The innovation of disk technology, especially the production of micro disks, makes disks bou...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/267
Inventor 刘发贵张晓杰刘飞谢然
Owner SOUTH CHINA UNIV OF TECH