Test machine for high and low temperatures

Abstract

The invention relates to a test machine for high and low temperatures. The test machine comprises test units and a plurality of independent test chambers. The test chambers are communicated with the external world through through holes at a box wall. A temperature control system respectively adjusts temperatures of the plurality of test chambers. Object placement plates are arranged at one ends of the test units and to-be-tested objects are placed on the object placement plates; and the other ends of the test units are provided with a control circuit board. One ends of the test units are inserted into the test chambers through the through holes, wherein the one ends of the test units are provided with the object placement plates, and the control circuit board is arranged outside the box. After a test is over, the test units are drawn out of the test chambers. According to the invention, an independent temperature control system with a plurality of test chambers is employed, so that a test demand of a small amount and multiple kinds is met and an utilization rate of the test machine is improved; a control circuit board is arranged outside the box of the test machine, so that the service life of the test machine is substantially improved; and test units and the box are in plug connections, so that the test machine can be used conveniently and the appearance of the whole machine is beautiful.

Description

technical field [0001] The invention relates to a high and low temperature reliability test device for industrial products, in particular, a performance index test device for electronic and electrical component products under high and low temperature control. Background technique [0002] Industrial products usually require reliability tests in high and low temperature application environments. For example, parts and materials of related products such as electronics, automobiles and motorcycles, especially computer hard disks, are tested for their various performance indicators under the condition of alternating high and low temperatures. [0003] The existing high and low temperature testing machine is a box structure with a built-in temperature control system. Open the box door, put a number of test objects into the box, then close the box, and set the high and low temperature changes in the box through the temperature control system. , so that the object is in a high an...

AI Technical Summary

Problems solved by technology

[0004] The above-mentioned existing high and low temperature testing machines have such defects: First, the volume of the entire box is up to 100,000, but the inside of the box is a single temperature environment, and it is impossible to place in the testing machine at the same time for the testing of objects with different ambient temperature tolerances. , can only be tested separately

For a small number of sporadic objects or even a single object, the testing machine must also be independently occupied, which will not only delay time, but also waste energy

Second, for the high and low temperature testing machine used for computer hard disk testing, since the control circuit board is located in the test box, the service life of the control circuit board is greatly reduced due to the harsh test environment

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