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Testing method and testing device

A test method and test equipment technology, applied in the test field, can solve problems such as data destruction and data error

Inactive Publication Date: 2012-06-27
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, testing the memory may corrupt data in memory, and accessing corrupted data may result in errors

Method used

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Examples

Experimental program
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Embodiment 1

[0027] figure 1 It is a schematic flow chart of a test method provided by the embodiment of the present invention. Such as figure 1 Shown, the test method of the present embodiment comprises:

[0028] 101. Write first data in a first memory to be tested into a second memory.

[0029] 102. During the process of testing the first memory, when it is desired to access the first data in the first memory, perform a first access to the first data written in the second memory.

[0030] Both 101 and 102 involve access to memory. Accesses to memory can be read operations as well as write operations. The subject that accesses the memory may be the driver of the memory, or the test software, the operating system and the file system. Among them, the driver can directly access the memory. The operating system can access memory through drivers. When there is a file system, the file system can access the memory through the driver program under the control of the operating system. Test...

Embodiment 2

[0042] figure 2 It is a schematic flow chart of another testing method provided by the embodiment of the present invention. Such as figure 2 Shown, the test method of the present embodiment comprises:

[0043] 201. Write data in the first memory to be tested into the second memory.

[0044] 202. Test the foregoing first memory.

[0045] 203. After the test is completed, write the data written in the second memory into the first memory, so as to access the data through the first memory.

[0046] Both 201 and 203 involve access to memory. Access to memory can be a read operation or a write operation. The subject that accesses the memory may be the driver of the memory, or the test software, the operating system and the file system. Among them, the driver can directly access the memory. The operating system can access memory through drivers. When there is a file system, the file system can access the memory through the driver program under the control of the operating sys...

Embodiment 3

[0052] image 3 It is a schematic flowchart of another testing method provided by the embodiment of the present invention, and this embodiment is applicable to flash memory. Such as image 3 Shown, the testing method of the present embodiment can comprise:

[0053] 301. Write data in the flash memory block to be tested into a cache block corresponding to the flash memory block to be tested in the cache.

[0054] For example: the data in the flash memory block to be tested can be read first, and then the above data is written into the cache block corresponding to the flash memory block to be tested in the cache.

[0055] Wherein, the flash memory may be divided into several flash memory blocks of equal or different sizes.

[0056] Optionally, before 301, the correspondence between the at least one flash memory block and the cache block in the cache may be further established, so as to write the read data into the cache corresponding to the flash memory block to be tested in ...

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Abstract

An embodiment of the invention provides a testing method and a testing device. The testing method includes that first data to be tested are written to a second storage device, and the data to be tested are in a first storage device; and in a process of testing the first storage device, when users want to access the first data in the first storage device, first access is executed on the first data written to the second storage device. By means of the testing method and the testing device, accessed data are not damaged by testing, therefore a problem of errors caused by the damaged data in the prior art is solved.

Description

technical field [0001] The present invention relates to testing technology, in particular to testing method and equipment. Background technique [0002] Using test software to test memory is widely used in the field of hardware development. For example, test software uses test data to test flash memory. The specific process may be: first write the test data into the storage block of the memory to be tested, and then read the storage block. By comparing whether the written test data is consistent with the read data, it is judged whether the memory to be tested is normal. [0003] However, testing the memory may corrupt data in the memory, and accessing corrupted data may result in errors. Contents of the invention [0004] On the one hand, the embodiment of the present invention provides a kind of test method, comprising: [0005] writing the first data in the first memory to be tested into the second memory; [0006] In the process of testing the first memory, when th...

Claims

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Application Information

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IPC IPC(8): G11C29/56
Inventor 李坤
Owner HUAWEI TECH CO LTD
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