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Random flip fault injection method aiming at SRAM (Static Random Access Memory) type FPGA (Field Programmable Gate Array)

A fault injection, bit computer technology, applied in instruments, electrical digital data processing, computing, etc., can solve the problem of inability to determine the refresh cycle of the configuration storage unit, and the problem of unresolved, achieves the effect of less time spent and accurate refresh cycle

Inactive Publication Date: 2014-07-02
BEIHANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, it does not solve the problem that the user cannot determine the refresh cycle of the configuration storage unit in practical applications.

Method used

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  • Random flip fault injection method aiming at SRAM (Static Random Access Memory) type FPGA (Field Programmable Gate Array)
  • Random flip fault injection method aiming at SRAM (Static Random Access Memory) type FPGA (Field Programmable Gate Array)

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Embodiment Construction

[0034] The present invention will be further described in detail with reference to the accompanying drawings and embodiments.

[0035] The invention is a random flipping fault injection method for SRAM type FPGA, which includes two modes of multi-bit random flipping and unit random flipping.

[0036] For the multi-bit random flip mode, a random flip fault injection method for SRAM FPGA of the present invention, the process is as follows figure 1 shown, including the following steps:

[0037] Step 1: Initial configuration;

[0038] After the test starts, first the controller initializes the configuration of the chip under test;

[0039] Step 2: Set the simulated radiation dose and simulated radiation time;

[0040] The user sets the simulated radiation dose and simulated radiation time;

[0041] Step 3: Determine the flipped bits, and randomly flip M bits;

[0042] According to the simulated radiation dose and simulated radiation time set by the user, the host computer det...

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PUM

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Abstract

The invention discloses a random flip fault injection method aiming at an SRAM (Static Random Access Memory) type FPGA (Field Programmable Gate Array). The random switching fault injection method aims at circuits which are realized by the SRAM type FPGA, makes use of the advantages of dynamic reconfiguration of the circuits so as to manually introduce fault having the same efficacy with single particle upset into the FPGA by upsetting bits by flipping the bit; on the one hand, a memory unit is configured for a design circuit so as to perform a plurality of bits of random fault injection, so that the radiation simulation is replaced, and the effectiveness of circuit design protective means is evaluated; and on the other hand, by a single bit of random fault injection, flips are accumulated until functional error appears, thereby obtaining a refreshing period of the configured memory unit.

Description

technical field [0001] The invention relates to a random flipping fault injection method based on SRAM type FPGA, which belongs to the technical field of FPGA space reliability. Background technique [0002] After a single-event upset occurs in the FPGA, its failure manifests itself as a change in the contents of memory cells in the FPGA, and the contents of these memory cells are determined by the bits in the configuration file. At present, radiation simulation is mainly used for single event upset in the simulated space on the ground, that is, heavy ions or high-energy protons and other simulated sources are used to irradiate the device, and the radiation sensitive parameters are tested for the selection of the device and the estimation of the actual radiation environment. The single event turnover rate provides the basis. [0003] If the method of radiation simulation is adopted, firstly, the irradiated devices can no longer be used, thus increasing the cost of the test;...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/00
Inventor 潘雄朱明达张家铭李安琪宋镜明张忠钢金靖
Owner BEIHANG UNIV