Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Method and device for optimizing short-term stability parameters of atomic frequency standard

An atomic frequency scale and stability technology, applied in the direction of automatic power control, electrical components, etc., can solve the problem of inaccurate optimal working parameter points, balance long-term stability, accurate working parameter points, and improve short-term stability. Effect

Inactive Publication Date: 2012-08-01
JIANGHAN UNIVERSITY
View PDF2 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This is because the existing parameter optimization experiments adopt the method of pre-fixing some system parameters, ignoring the influence of the interaction between the system parameters, so the final optimal working parameter point is not accurate, which limits the atomic frequency. Further improvement of the short-term stability of the target

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and device for optimizing short-term stability parameters of atomic frequency standard
  • Method and device for optimizing short-term stability parameters of atomic frequency standard
  • Method and device for optimizing short-term stability parameters of atomic frequency standard

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0056] see figure 1 , Embodiment 1 of the present invention provides a method for optimizing short-term stability parameters of an atomic frequency standard, which specifically includes:

[0057] 101: Set multiple working parameter points; each working parameter point includes multiple experimental points and each experimental point corresponds to a different parameter to be optimized, each parameter to be optimized corresponds to multiple experimental points and the number of corresponding experimental points is the same, and The experimental points corresponding to the same parameter to be optimized are evenly distributed in the value range of the parameter to be optimized and include the two ends of the value range. There is at most one experimental point in every two working parameter points that is the same, and each experimental point is in all The number of occurrences in the working parameter points is equal; the parameters to be optimized include modulation depth, mod...

Embodiment 2

[0063] see figure 2 , Embodiment 2 of the present invention provides a method for optimizing short-term stability parameters of an atomic frequency standard, the method comprising:

[0064] 201: Set multiple working parameter points; each working parameter point includes multiple experimental points and each experimental point corresponds to different parameters to be optimized, and each parameter to be optimized corresponds to multiple experimental points and the number of corresponding experimental points is the same , the experimental points corresponding to the same parameter to be optimized are evenly distributed in the value range of the parameter to be optimized and include the two ends of the value range, at most one experimental point is the same in every two working parameter points, and each experimental point The number of occurrences in all working parameter points is equal; the parameters to be optimized include modulation depth, modulation frequency and microwa...

Embodiment 3

[0110] In order to facilitate the description of the device of the present invention, the structure of the atomic frequency standard is first introduced below. see Figure 6 , Atomic frequency standards generally include physical systems 1 and electronic circuits. The physical system 1 includes a C-field coil 1a, a microwave cavity 1b, and the like. The electronic circuit mainly includes an isolation amplifier 2, a microwave multiplier, a frequency mixer 3, a synthesizer 4, a servo circuit 5 and a voltage-controlled crystal oscillator 6. The servo circuit 6 includes a pre-amplifier and a lock-in amplifier. Based on this, see Figure 7 , Embodiment 3 of the present invention provides a device for optimizing long-term stability parameters of an atomic frequency standard, which specifically includes:

[0111] Setting module 301, modulation depth adjustment module 302, modulation frequency adjustment module 303, microwave power adjustment module 304 and calculation module 305;...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method and a device for optimizing short-term stability parameters of an atomic frequency standard, which belong to the field of the atomic frequency standards. The method comprises the steps that a plurality of working parameter points are set; each working parameter point includes a plurality of experiment points which correspond to different parameters to be optimized, each parameter to be optimized corresponds to the plurality of experiment points, and the quantities of the corresponding experiment points are the same, the experiment points corresponding to the same parameter to be optimized are evenly distributed in a value area including two end points of the parameter to be optimized, at most one same experiment point exists in every two working parameter points, and the frequency of each experiment point in all the working parameter points is the same; each parameter to be optimized includes modulation depth, modulation frequency and microwave power; according to each working parameter point, the modulation depth, the modulation frequency and the microwave power are respectively regulated; and frequency discrimination gradient of the atomic frequency standard corresponding to each working parameter point is calculated, and the optimal working parameter point is selected. The method and the device improve the short-term stability of the atomic frequency standard.

Description

technical field [0001] The invention relates to the field of atomic frequency standards, in particular to a method and device for optimizing short-term stability parameters of atomic frequency standards. Background technique [0002] The parameter optimization of the atomic frequency standard includes the long-term stability parameter optimization and the short-term stability parameter optimization of the atomic frequency standard. Short-term stability parameter optimization is to obtain the best working parameter points of all system parameters that affect short-term stability through relevant optimization experiments. The system parameters that affect short-term stability mainly include modulation depth and modulation frequency. [0003] The existing short-term stability parameter optimization experiment takes the modulation depth and modulation frequency as the parameters of the system under test, and then optimizes the parameters of the system under test one by one. Fo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H03L7/26
Inventor 詹志明雷海东
Owner JIANGHAN UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com