Micro control unit (MCU) built-in reference temperature compensation method based on system on chip (SOC) electric meter

A technology of reference temperature and compensation method, which is applied in the direction of measuring devices, measuring electrical variables, instruments, etc., can solve the problems of high price, achieve low cost, good stability, and simplify the effect of temperature compensation processing

Active Publication Date: 2012-09-12
WASION GROUP HLDG
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Problems solved by technology

Although there are external dedicated reference chips with built-in tempe

Method used

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  • Micro control unit (MCU) built-in reference temperature compensation method based on system on chip (SOC) electric meter
  • Micro control unit (MCU) built-in reference temperature compensation method based on system on chip (SOC) electric meter
  • Micro control unit (MCU) built-in reference temperature compensation method based on system on chip (SOC) electric meter

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[0025] The first thing to be done in the method of the present invention is to establish a temperature compensation data table, which can be done as follows in specific implementation:

[0026] a. Put the meter in a temperature-adjustable high and low temperature box to work. We can first set an ambient temperature range. This range should be the temperature range that the meter's working environment can reach, for example, set at -40℃ to +80. ℃, and then according to the principle of temperature from low to high, first set the high and low temperature box at -40℃, after the temperature stabilizes, use a high-precision digital multimeter to measure and record the output voltage value of the MCU built-in reference, which is recorded as u(- 40);

[0027] b. Calculate the MCU built-in reference voltage error e(-40),

[0028] The applicable formula is: e(-40)=u(-40)-u 0 ,

[0029] Where u 0 It is the calibrated output value when the MCU built-in reference is at room temperature (25 degre...

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Abstract

The invention discloses a micro control unit (MCU) built-in reference temperature compensation method based on a system on chip (SOC) electric meter. The method comprises the following steps of: measuring relation data of a built-in reference and temperature as well as of a built-in error and the temperature, calculating a corresponding relation of a required fine adjustment factor for correcting the built-in reference and the temperature, storing relevant data points, and constructing a compensation data sheet for lookup; regularly reading on-chip temperature by using an on-chip temperature sensor of the MCU, and calculating a built-in reference fine adjustment factor at the temperature by adopting a method combined with lookup and interpolation; and setting a value of a built-in reference digital adjustment register according to the fine adjustment factor, and compensating the fluctuation of the built-in reference, which is caused by change of the temperature. According to the method, the influence of a temperature effect on reference voltage, an analog/digital (A/D) conversion result and the electric energy measurement precision is avoided, the subsequent temperature compensation processing loop is simplified, the operability is high, the cost is low, and the stability is high; and the method can be widely applied to the field of electric energy metering based on an embedded SOC scheme.

Description

technical field [0001] The invention mainly relates to the technical field of electric energy measurement, in particular to an MCU built-in reference temperature compensation method based on an SOC chip electric meter. Background technique [0002] With the gradual development of large-scale integrated circuits and the maturity of SOC technology, the energy meter measurement scheme has gradually entered the era of SOC single-chip design scheme. [0003] Most of the smart meters based on the embedded SOC chip solution use on-chip A / D and other analog components to complete analog signal acquisition. The reference voltage is used to provide a reference voltage for the resistor ladder network in the A / D converter, which is essential in analog signal acquisition. Both theory and practice show that the fluctuation of the reference voltage will cause a large error in the A / D conversion result, thereby affecting the measurement accuracy. In practical applications, the reference v...

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Application Information

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IPC IPC(8): G01R22/10
Inventor 汪龙峰任智仁贾俊周宣韩潇俊黄杰
Owner WASION GROUP HLDG
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