Unlock instant, AI-driven research and patent intelligence for your innovation.

Method for quickly positioning failure of product

A positioning method and fault technology, applied to measuring devices, instruments, measuring electronics, etc., can solve the problems of wasting time and low efficiency, and achieve the effect of simple principle, low cost, and improved efficiency of testing and troubleshooting

Inactive Publication Date: 2015-07-22
LUOYANG INST OF ELECTRO OPTICAL EQUIP OF AVIC
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a method for quickly locating product faults to solve the problems of low efficiency, waste of time and energy in existing fault detection methods

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for quickly positioning failure of product
  • Method for quickly positioning failure of product

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0012] Aiming at the problem of too rough positioning of product failure causes, the concept of failure database is proposed based on the understanding of the detection mechanism of the automatic detector and the analysis of the principle of the tested circuit. The principle and preparation method of the fault database are as follows: First, number the signals that need to be tested in sequence, and summarize the cause of each signal detection error and suspicious devices, and finally input the name, number, error cause and suspicious devices of each signal into the database. When testing the product, if a fault occurs, the test software will access the fault database through a certain method according to the fault code, and the cause of the fault and the device code that may cause the fault will pop up on the desktop for the reference of the debugger. Therefore, personnel only need to simply test the suspicious device, and basically can accurately locate the fault. Therefore,...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method for quickly positioning a failure of a product. The method comprises the following steps of: analyzing signals to be tested one by one, finding a suspicious failing device associated with each signal, and generating a failure database; performing failure detection on the product, and if the failure of the product is detected, accessing the failure database, and displaying a reason for the failure and a suspicious failing device number; and detecting a failing device according to the suspicious failing device number to quickly position the failure of the product by a debugger. According to the method, the failure database is established at first, and is directly accessed when the failure is detected, and a suspicious device is directly detected according to the display of the failure database to quickly position the failure of the product; and therefore, by the failure database, the complex process of analysis from a system is substantially eliminated, and the testing efficiency and failure clearing efficiency are remarkably improved. A simple principle is adopted, and the method is convenient, quick and low in cost.

Description

technical field [0001] The invention belongs to the technical field of virtual instrument testing, and relates to a method for quickly locating product faults. Background technique [0002] Automatic detection equipment will greatly improve the detection efficiency and shorten the detection time of the product under the premise that the product under test is functioning normally. For debuggers, the problem of excessively rough positioning of the cause of the fault is exposed. Debugging or troubleshooting personnel must be familiar with the principles of various signals in order to quickly troubleshoot. Otherwise, they can only push from the system to components according to the signal names, then from components to boards, and finally from boards to components. Obviously, this method is extremely inefficient and a serious waste of time and energy. Contents of the invention [0003] The purpose of the present invention is to provide a method for quickly locating product f...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 邵咏松喻波
Owner LUOYANG INST OF ELECTRO OPTICAL EQUIP OF AVIC