Forward overload test device
An overload test and output technology, applied in the direction of single semiconductor device testing, etc., can solve the problems of high temperature, forward voltage drop, power consumption and forward current, severe heating, etc., and achieve the effect of ensuring accuracy
Active Publication Date: 2015-06-10
江苏皋鑫电子有限公司
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Problems solved by technology
Due to the large forward voltage drop, power consumption and forward current in high-power devices, severe heat generation and high temperature, the conventional constant current source cannot meet its fluctuation range
Method used
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[0007] Such as figure 1 As shown, it includes AC power supply 1, transformer 2, rectifier 3, pulse oscillator 4, constant current source 5, drive circuit 6, high voltage diode 7, servo circuit 8 and current fluctuation sampling circuit 9.
[0008] The output terminal of the AC power supply 1 is connected to the input terminal of the transformer 2, the output terminal of the transformer 2 is connected to the input terminal of the rectifier 3, the input terminal of the rectifier 3 is connected to the input terminal of the pulse oscillator 4, and the output terminal of the pulse oscillator 4 is connected to the input terminal of the pulse oscillator 4 through the drive circuit 6. The constant current source 5 is connected, and the output terminal of the constant current source 5 is loaded on the high voltage diode 7 .
[0009] It also includes a servo circuit 8 and a current fluctuation sampling circuit 9 , the input end of the current fluctuation sampling circuit 9 is connected ...
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The invention relates to a forward overload test device which comprises an alternating-current power supply, a transformer, a rectifier, an impulse oscillator and a constant current source, wherein the output end of the alternating-current power supply is connected with the input end of the transformer, the output end of the transformer is connected with the input end of the rectifier, the input end and the output end of the rectifier are connected with the input end of the impulse oscillator, the output end of the impulse oscillator is connected with the constant current source through a driving circuit, and the output end of the constant current source is loaded on a high-voltage diode. The forward overload test device is characterized by further comprising a servo circuit and a current fluctuation sampling circuit, wherein the input end of the current fluctuation sampling circuit is connected with the high-voltage diode, and the output end of a current fluctuation driving circuit is connected with the constant current source. The current fluctuation sampling circuit is used for detecting the current loading the high-voltage diode and inputting the signal into the servo circuit, and the servo circuit is used for controlling the constant current source, so that the fluctuation range can be controlled within 5%, and the test accuracy can be guaranteed.
Description
technical field [0001] The invention relates to a forward overload test device, in particular to a forward overload test device with a small fluctuation range of a constant current source. Background technique [0002] In the process of producing diodes, a forward overload test is required, which loads the constant current source on the high-voltage diode through the periodic pulse interval of the pulse oscillator, which requires the fluctuation range of the constant current source to be below 10%. Due to the large forward voltage drop, power consumption and forward current in high-power devices, severe heat generation and high temperature, the conventional constant current source cannot meet its fluctuation range. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a forward overload test device with a small fluctuation range of a constant current source. [0004] In order to solve the above-mentioned technical pro...
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IPC IPC(8): G01R31/26
Inventor 许铁华孙建兵
Owner 江苏皋鑫电子有限公司