Method and device for selecting test point of artificial electromagnetic material unit
A technology of artificial electromagnetic materials and test points, applied in the field of metamaterials, can solve the problems of consuming large resources and achieve the effects of saving test resources, reducing the number of selections, and optimizing test design
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0023] Embodiments of the present invention provide a method and device for selecting test points of an artificial electromagnetic material unit. Each will be described in detail below.
[0024] The flow chart of the test point selection method of a kind of artificial electromagnetic material unit in embodiment 1 of the present invention can refer to figure 1 , the method includes:
[0025] Step 101, acquiring the geometric parameters of the artificial electromagnetic material unit to be tested and the number of sample points for sampling the geometric parameters.
[0026] The geometric parameters may be a set of parameter descriptions representing the geometric shape and size of the artificial electromagnetic material, and each parameter corresponds to multiple value levels. For example: the artificial electromagnetic material unit of a kind of " I " topological structure, its geometric parameter is defined as a vector G=[a, b, w], and the value ranges of a, b and w three ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com