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Relevance labeling method of faulty components in test results of composite circuit board

A technology of test results and combined circuits, applied in instruments, electrical digital data processing, calculation, etc., can solve problems such as strong professionalism and unintuitive description of faulty components, improve work efficiency and correctness, and reduce test expertise Relying on and testing experience, the method is simple and easy to achieve

Active Publication Date: 2015-10-21
HEFEI UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a method for labeling the relevance of faulty components in the test results of a combined circuit board to solve the problem of unintuitive and highly professional description of circuit board faulty components under the existing technical conditions

Method used

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  • Relevance labeling method of faulty components in test results of composite circuit board
  • Relevance labeling method of faulty components in test results of composite circuit board
  • Relevance labeling method of faulty components in test results of composite circuit board

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment

[0046] The combination of the combined circuit board is shown in Table 1:

[0047] Table 1 is figure 2 Composition table of composite circuit board corresponding to the composite circuit board in

[0048] board number

Slot number

Inserted circuit board number

B1

S1

B2

[0049] The association table of the faulty components of the circuit board is shown in Table 2:

[0050] Table 2 is the fault component association table

[0051]

[0052] According to Table 1, the board number, slot number, and inserted circuit board number of the circuit board can be obtained; according to the board number of the circuit board in Table 1, look up Table 2, and the device bit number and pin number of each circuit board can be obtained. That is, the associated faulty components on the combined circuit board are obtained; the position and size of each device tag on the circuit board can be obtained by looking up the device tag number in Table 3. Table...

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Abstract

The invention discloses a relevance marking method for faulted devices in a combined circuit board test result. The relevance marking method comprises the following steps of: acquiring an overall structure of a combined circuit board according to a combination mode of the loaded combined circuit board; acquiring information about all related faulted device groups from a device relevance table, acquiring position and specification information of each device in the device groups from a circuit board specification information table, and acquiring pin information of the devices from a device detailed statement; acquiring a three-dimensional model of the combined circuit board according to the information and three-dimensional models of circuit boards forming the combined circuit board; and finally, marking and displaying the related faulted devices in the three-dimensional model of the combined circuit board according to the information in a faulted device relevance table.

Description

technical field [0001] The invention relates to the field of circuit board design, in particular to a correlation labeling method for faulty components in test results of a combined circuit board. Background technique [0002] In the test results of the combined circuit board, there will be a list of faulty components, and the relationship between the faulty pins and the pins in the list. Because these correlations need to be displayed to the tester, and the correlations of the faulty components in the test results of the existing combined circuit boards are only displayed through tables and text descriptions. On the one hand, the correlations of the faulty components are not convenient and intuitive; on the other hand On the one hand, the requirements for testers are high, requiring testers to be able to understand component libraries and design documents, and to have high hardware expertise. It can be seen that the existing methods rely too much on circuit test expertise a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50
Inventor 路强刘晓平杨柳青储晓丽余烨
Owner HEFEI UNIV OF TECH
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