Heavy-current mutual inductor error testing method and anti-toppling testing brackets for GIS (Gas Insulated Substation)

Abstract

The invention relates to a heavy-current mutual inductor error testing method and anti-toppling testing brackets for a GIS (Gas Insulated Substation). The heavy-current mutual inductor error testing method belongs to the technical field of a mutual inductor. The technical art is as follows: the tested heavy-current mutual inductor (2) for the GIS is arranged between the two anti-toppling testing brackets to prevent toppling; a position of a supporting plate (4) on the anti-toppling testing brackets is adjusted according to the outer diameter of the tested heavy-current mutual inductor, so that a primary testing conductor (3) for test can be supported by the supporting plate, thereby ensuring that the primary testing conductor always penetrates through a centre of the tested heavy-current mutual inductor for the GIS. The invention has positive effects of effectively preventing the heavy-current mutual inductor from toppling, effectively ensuring that the primary testing conductor always penetrates through the centre of a tested product through position adjustment of the supporting plate on the anti-toppling testing brackets, fully avoiding an affect of electromagnetic interference and realizing an accurate and reliable testing result.

Description

technical field [0001] The invention relates to an error test method and an anti-dumping test bracket for a large current transformer used in GIS, and belongs to the technical field of transformers. Background technique [0002] For the error test of large current transformers used in GIS, platform-type test methods are traditionally used. For example, the error tests of large-current transformers used in Mitsubishi GIS in Japan all use platform-type test methods. When this method is tested, the product to be tested is placed flat on the test device, and the product has strong stability. However, there are the following problems: the manufacturing cost of the test device is high, the conductor connection of a test is complicated, the disassembly and assembly takes a long time, the test efficiency is not high, and it takes up a lot of space. Due to the large outer limit size of the high-current transformer used for GIS, especially the large outer diameter, it is easy to fall...

AI Technical Summary

Problems solved by technology

However, there are the following problems: the manufacturing cost of the test device is high, the connection of the test conductor is complicated, the disassembly and assembly takes a long time, the test efficiency is not high, and it takes up a lot of space

Due to the large outer limit size of the large current transformer used for GIS, especially the large outer diameter, it is easy to fall over during the test process, and the product or test personnel may be injured.

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