Method for correcting infrared focal plane heterogeneity based on sigma filter
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HUAZHONG UNIV OF SCI & TECH
- Publication Date
- 2013-03-13
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the field of image detection and processing, and more specifically relates to a method for correcting non-uniformity of an infrared focal plane based on a sigma filter. Background technique
[0002] Detector non-uniformity has a serious impact on the performance of many imaging systems, especially infrared imaging systems. In the Focal Plane Array (FPA for short), due to the difference in the manufacturing process of each detector element that constitutes the array, the response characteristics to the same input are not the same, which is called the non-uniformity of the focal plane array. Non-uniformity manifests itself as Fixed Pattern Noise (FPN) overlaid on the actual scene in the output image. FPN seriously affects the performance of applications such as infrared image target detection and recognition, and must be suppressed or eliminated through calibration. Since non-uniformity drifts with time and environmental condit...