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Ion Sources for Mass Spectrometry

A mass spectrometer and gas source technology, which is applied in the field of ion sources for mass spectrometry analysis, can solve the problems of affecting the performance of mass spectrometers, reducing sampling efficiency, and reducing performance of mass spectrometers

Inactive Publication Date: 2017-10-03
DH TECH DEVMENT PTE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] In addition, the use of many "liquid-to-droplet" conversion methods that do not produce a directed sample plume with a net velocity can lead to inefficient sampling and thus severely degraded mass spectrometer performance
[0007] Even in conventional techniques that overcome some of the above disadvantages, confining, moving, ionizing, and drying sample streams (e.g., droplet streams) present challenges that can adversely affect mass spectrometer performance

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  • Ion Sources for Mass Spectrometry
  • Ion Sources for Mass Spectrometry
  • Ion Sources for Mass Spectrometry

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[0100] Applicants' teachings can be more fully understood with reference to the following examples and resulting data. Other embodiments of the applicant's teachings will be apparent to those skilled in the art from consideration of the present specification and practice of the present teachings disclosed herein. These examples are intended to be considered illustrative only. The examples are provided for purposes of illustration and do not necessarily indicate the best way of carrying out the applicant's teachings, or the best results that can be obtained.

[0101] A system in which a relatively small amount of higher velocity gas is used to deflect and shape a larger amount of lower velocity gas is studied theoretically using computational fluid dynamics (CFD) models. More specifically, in many instances, the interaction of a small volume of low velocity nebulizer gas with heater gas flow was modeled. use figure 1 The apparatus depicted in , with the following dimensions...

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Abstract

Systems and methods for delivering a sample into a mass spectrometer are provided. In one aspect, the system may include a sample source for generating a sample plume entrained in the primary gas flow in a first flow direction at a first flow rate; A secondary flow is generated in a second flow direction and at a second flow rate greater than the first flow rate. The sample source and the gas source may be positioned relative to each other such that the primary gas flow intersects the secondary gas flow to produce a resulting gas flow that travels along a trajectory different from the first and second directions, to The sample was brought near the sampling port of the mass spectrometer.

Description

[0001] Related applications [0002] This application claims priority to US Provisional Application Serial No. 61 / 379,196, filed September 1, 2010, which is hereby incorporated by reference in its entirety. technical field [0003] The present teachings relate to methods, systems, and devices for directing a sample (eg, an analyte of interest) to a sampling port of a mass spectrometer. Background technique [0004] Mass spectrometers allow the detection, identification and quantification of chemical entities in unknown samples. The chemical entities are detected in ionic form, and thus conversion of the chemical entities to charged ions occurs during the sampling process. Liquid samples are conventionally converted to the gas phase by using nebulizers, nebulizers, and / or electroinjectors, which can generate a plume that is directed to the sampling port of the mass spectrometer. For example, a liquid sample can be converted into multiple micro-droplets entrained in a carri...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/04
CPCH01J49/04H01J49/0422
Inventor 彼得·科瓦里克托马斯·R·柯维
Owner DH TECH DEVMENT PTE