Silicon wafer-level automatic tester and test method for usb chip
A silicon-level, tester technology, applied in the field of USB chip silicon-level test, USB chip silicon-level tester, can solve the problem of unable to realize the response signal processing of USB chip, so as to reduce the test cost and improve the same test. number, the effect of avoiding test errors
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[0033] Such as image 3 As shown, it is a schematic diagram of a silicon-level automatic tester for a USB chip according to an embodiment of the present invention. The embodiment of the present invention USB chip silicon chip level automatic tester 1 is used for the silicon chip level test of USB chip 2, comprises: test channel 3, failure data memory 4, random access memory 5, non-return-to-zero inversion decoding module 6, data file 7 and test procedure 8.
[0034] The test channel 3 includes multiple and is used to connect with one or more USB chips 2, wherein every two test channels are connected to one of the USB chips 2, and the test channel is used to receive each of the USB chips 2 The returned handshake response signal or data. The DP signal pin and the DM signal pin of each USB chip 2 are respectively connected to one of the test channels 3 . The handshake response signal or data handshake response signal includes ACK, NAK, STALL, and the data flow type of the hand...
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