The invention discloses a circuit detection method and device in
chip testing, and belongs to the technical field of
chip testing. The method comprises the following steps: respectively distributing corresponding target
voltage amplitudes for a plurality of
digital input / output (DIO) channels between
test equipment and a test circuit board; when the actual
voltage value of each DIO channel in the plurality of DIO channels is within a preset range, displaying a prompt that the channel connection is correct on a test interface, and starting a subsequent
test program; or when the actual
voltage value of at least one DIO channel in the multiple DIO channels is not within the preset range, a prompt of channel connection errors is displayed on the test interface, and starting of the follow-up
test program is interrupted. According to the method, after the target
voltage amplitude is distributed, the actual voltage value in each channel is detected to judge the line connection state, the test is interrupted in time when the connection fails, test errors caused by line connection errors are effectively prevented, and the
chip test efficiency and reliability are improved.