Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Total reflection type Terahertz-wave scanning imaging device

A total reflection and imaging device technology, applied in the field of terahertz wave scanning imaging, can solve the problems of reducing imaging quality, increasing the complexity of scanning device movement, and prolonging imaging time, so as to improve imaging quality, save scanning and imaging time, and reduce Effect of system size

Inactive Publication Date: 2015-06-03
CAPITAL NORMAL UNIVERSITY
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In total reflection scanning imaging, the system that uses the two-dimensional movement of the reflective surface to realize the scanning imaging of the imaged object will prolong the imaging time and reduce the imaging quality; the method of using a single scanning mirror to realize the scanning imaging of the measured object will Increased imaging time and increased motion complexity of the scanning device

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Total reflection type Terahertz-wave scanning imaging device
  • Total reflection type Terahertz-wave scanning imaging device
  • Total reflection type Terahertz-wave scanning imaging device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0028] The invention provides a total reflection terahertz wave scanning imaging device, such as figure 1 As shown, it includes a frame scanning plane mirror 3, a polyhedron focusing scanning mirror 4 and a terahertz detection device, wherein:

[0029] The frame scanning plane mirror 3 is placed in front of the imaging target 1, and can swing around the swing axis 9. The swing axis 9 is parallel to the object plane of the imaging target 1 and the reference horizontal plane. When the frame scanning plane mirror 3 rotates around the swing axis 9, relative to The imaging target 1 performs a pitching motion, which can complete the scanning of the imaging target 1 along the longitudinal range. The reference horizontal plane here refers to a plane perpendicular to the imaging target 1 .

[0030] The polyhedron focusing scanning mirror 4 is placed in the reflec...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a total reflection type Terahertz-wave scanning imaging device. A plurality of ellipsoidal lenses are adopted to form a polyhedron focusing scanning lens, wherein the ellipsoidal lenses are symmetrically arranged relative to the central axis through a focus in an ellipsoid on which the ellipsoidal lenses are arranged. When the polyhedron focusing scanning lens rotates to scan an imaged object, each ellipsoidal lens on the ellipsoid can converge Terahertz waves received from a frame scanning plane mirror to the other focus, deflection of a converging point cannot be caused by vibration of the ellipsoidal lens, so that imaging quality is improved. When the polyhedron focusing scanning lens rotates, through matching with the frame scanning plane mirror, each ellipsoidal lens which passes by a reflective light path of the frame scanning plane mirror can carry out one row of scanning on the imaged object in a transverse range, and the polyhedron focusing scanning lens rotates for a circle to obtain N rows of pixel data. Compared with a scanning imaging device with one ellipsoidal lens, the total reflection type Terahertz-wave scanning imaging device greatly improves the speed of scanning and imaging.

Description

technical field [0001] The invention relates to a terahertz wave scanning imaging technology, in particular to a total reflection terahertz wave scanning imaging device. Background technique [0002] Terahertz waves are between infrared and millimeter waves, and have good penetrability to textiles, leather and other materials, and the resulting images have higher spatial resolution; they are several orders of magnitude lower than X-ray energy, and will not affect biological tissues. Therefore, the terahertz wave imaging device is practical and can effectively complement traditional security inspection devices. [0003] At present, detectors in the terahertz band are expensive, and focal plane imaging cannot be used in terahertz imaging, and scanning imaging is mostly used. In the non-contact, large field of view, fast, and high-resolution human body terahertz scanning imaging that meets the needs of public places such as airports and stations, terahertz beam scanning imagin...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01V8/10
Inventor 邓朝张存林张亮亮梁来顺赵源萌
Owner CAPITAL NORMAL UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products