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Main control board testing method, device and system

A test method and the technology of the main control board, applied in the test field, can solve the problems of low test efficiency and high test cost, and achieve the effect of saving test cost and solving high test cost

Active Publication Date: 2016-02-24
GREE ELECTRIC APPLIANCES INC OF ZHUHAI
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the problems of high test cost and low test efficiency in the method of testing the main control board in the related technology, no effective solution has been proposed

Method used

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  • Main control board testing method, device and system
  • Main control board testing method, device and system
  • Main control board testing method, device and system

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Embodiment Construction

[0034] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0035] figure 1 It is a flow chart of the testing method of the main control board according to the present invention. figure 2 is based on figure 1 The test method of the main control board in the shown embodiment is applied to the flow chart of the method for testing the second-generation dehumidifier. like figure 1 As shown, according to an embodiment of the testing method of the main control board of the present invention, the method includes the following steps:

[0036] In step S101, the upper computer establishes a communication relationship with the main control board under test, so as to obtain the test data set on the main control board under test.

[0037] In step S103, the upp...

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Abstract

The invention discloses a main control panel test method, device and system. The main control panel test method includes the steps that a communication relationship is established between an upper computer and a main control panel to be tested, and then a test data set on the main control panel to be tested is obtained; the upper computer processes data in the test data set according to preset matching controller parameters in order to generate reply data corresponding to the matching controller parameters; the upper computer sends the generated reply data to the main control panel to be tested. Testing on the main control panel is completed by adopting the upper computer to simulate a matching controller to be in communication with the main control panel to be tested, the technical problems that in the prior art, the method for testing the main control panel is large in testing cost and low in testing efficiency are solved, and therefore the main control panel can be tested conveniently and quickly, and testing cost can be saved.

Description

technical field [0001] The invention relates to the field of testing, in particular to a testing method, device and system for a main control board. Background technique [0002] At present, the multi-connected and modular unit tests are all based on the real supporting controllers. When testing the main control board, it is necessary to connect the supporting controller. When it is necessary to change the state of the supporting controller to test the main control board, it is necessary to change the conditions according to the corresponding logic function book to achieve the purpose of changing the state of the supporting controller. This kind of test method is not only costly, but also takes a long time. [0003] The main disadvantages of the existing multi-connected and modular unit testing methods are as follows: 1. The testing cost is high. When testing the main control board, it is necessary to connect all supporting controllers, which is complex and time-consuming;...

Claims

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Application Information

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IPC IPC(8): G05B23/02
Inventor 牛安谭泽汉
Owner GREE ELECTRIC APPLIANCES INC OF ZHUHAI
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