A dual light source specular reflective surface measurement system
A specular reflection and surface measurement technology, applied in measurement devices, optical devices, material analysis by optical means, etc., can solve problems such as incompleteness, complex algorithms, and increased complexity, so as to remove speed bottlenecks and avoid mutual occlusion. , the effect of high measurement accuracy
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[0016] refer to Figure 1 ~ Figure 3 , the present invention provides a dual light source specular reflective surface measurement system, including a first point light source array 1 and a camera 3 that records the light emitted by the first point light source array 1 and reflected by the object to be measured 2, the first point light source A beam splitter 4 is provided between the array 1 and the object to be tested 2, and a second point light source array 5 is provided on one side of the beam splitter 4, and the light from the second point light source array 5 is reflected by the beam splitter 4 and the object to be tested 2 in turn, and then put into the camera3.
[0017] The working principle of the dual light source specular reflection surface measurement system is as follows:
[0018] When the second point light source array 5 is turned on and the first point light source array 1 is turned off, since the light splitter 4 has the ability of refraction (equivalent to tra...
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