Unlock instant, AI-driven research and patent intelligence for your innovation.

Method for manufacturing finfet devices

A device and sidewall spacer technology, applied in the field of manufacturing FinFET devices, can solve problems such as inability to achieve perfection

Active Publication Date: 2017-03-01
TAIWAN SEMICON MFG CO LTD
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

While existing FinFET devices and methods of fabricating FinFET devices are generally adequate for their intended use, they are still not perfect
For example, the height and width of the source / drain epitaxial structures change, which will bring challenges to the development of FinFET process

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for manufacturing finfet devices
  • Method for manufacturing finfet devices
  • Method for manufacturing finfet devices

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] The following disclosure provides a number of different embodiments or examples for implementing different features of the present invention. Specific examples of components and arrangements are described below to simplify the present disclosure. Of course, these are only examples and are not intended to limit the invention. For example, in the following description, forming a first component over or on a second component may include embodiments in which the first component and the second component are in direct contact, and may also include that other components may be formed between the first component and the second component An embodiment such that the first part and the second part are not in direct contact. Additionally, the present disclosure may repeat reference symbols and / or characters in different instances. This repetition is for simplicity and clarity, and does not in itself indicate a relationship between the various embodiments and / or configurations des...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

This aspect discloses a method for manufacturing a fin field effect transistor. To manufacture a FinFET device, you first receive a FinFET precursor. The precursor includes a substrate and fin structures on the substrate. Sidewall spacers may be formed along sidewalls of the fin structures in the precursor. A portion of the fin structure is slotted to form a slotted trench with the sidewall spacer as the upper portion of the fin. The semiconductor structure is grown epitaxially in and continuously over the slotted trench to form an epitaxial structure.

Description

technical field [0001] The present application relates generally to the field of semiconductors and, more particularly, to methods of fabricating FinFET devices. Background technique [0002] The semiconductor integrated circuit (IC) industry is developing rapidly. Due to technological advancements in IC materials and designs, ICs are constantly being updated, and new generations of ICs have smaller but more complex circuits than previous generation ICs. During the development of ICs, the functional density (i.e., the number of interconnected devices per chip area) has generally increased, but the geometry size (i.e., the smallest component (or line) that can be obtained by the manufacturing process) has been reduced. . The advantages of this scale-down process are increased production efficiency and reduced associated costs. [0003] This scaling process also increases the complexity of the IC's processing and fabrication. To achieve these advances, we need similar deve...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/336
CPCH01L29/66553H01L29/66795H01L29/41791H01L29/66636H01L29/7848H01L29/785H01L21/3065H01L21/76224H01L21/823814H01L21/823821H01L21/823864H01L21/823878H01L27/0924H01L29/0653H01L29/41766H01L29/6656H01L29/7851
Inventor 巫凯雄曾博瑞简珮珊曾伟雄
Owner TAIWAN SEMICON MFG CO LTD