Burn-in test device
A test device and burn-in technology, which is applied in the direction of measurement device, measurement of electricity, measurement of electric variables, etc., can solve the problems of uneven heating of the panel, affecting the circulation of heating airflow, and occupying space, so as to increase the number and increase the test efficiency.
Inactive Publication Date: 2014-04-09
致茂电子(苏州)有限公司
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Problems solved by technology
[0004] Based on the above, when the electronic product is a panel, the existing technology is to tilt the two panels against each other to increase the heating area of the panel. However, this method takes up a lot of space and will reduce the burn-in test The number of panels that can be accommodated in the device, which in turn reduces the efficiency of testing panels
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[0049] Since the burn-in test device provided by the present invention can be widely used in the burn-in test of various electronic components, and its combination implementations are too numerous to enumerate, so it will not be repeated here, and only the preferred embodiments will be listed. Be specific.
[0050] see Figure 1 to Figure 5 , figure 1 A three-dimensional schematic view showing the burn-in test device of the present invention; figure 2 A three-dimensional schematic diagram showing the burn-in test device of the present invention without showing the shell; image 3 The three-dimensional schematic diagram of the main body of the burner furnace, the partition, the return air partition and the heating partition of the display part; Figure 4 It is a schematic plan view of the burner furnace body, fan module and heating module; Figure 5 A schematic plan view showing that the burn-in test device of the present invention does not include a casing. As shown in t...
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A burn-in test device comprises a burn-in furnace body, a plurality of burn-in test racks, a fan module and a heating module. The burn-in furnace body comprises a shell and a partition plate, wherein the partition plate is arranged in the shell along a first direction to form a heating space and a burn-in space, and the partition plate is provided with a return air inlet and an air outlet. The burn-in test racks are accommodated in the burn-in space for a to-be-tested panel to be placed in a second direction perpendicular to the first direction. The fan module is arranged in the heating space so as to push air downward into the burn-in space. The heating module is arranged in the heating space and used for heating air. Pushing of the fan module and heating of the heating module enable air inside the burn-in test device body to recurrently circulate in the heating space and the burn-in space.
Description
technical field [0001] The invention relates to a burn-in test device, in particular to a burn-in test device which uses a partition to separate a heating space and a burn-in space. Background technique [0002] Generally speaking, after the electronic product is manufactured, various quality tests are usually carried out, among which the burn-in test is a very important part of the quality test of the electronic product. [0003] However, in the existing burn-in test technology, the electronic product to be tested is usually put into a burn-in test device to heat the electronic product to perform the burn-in test. Wherein, since the existing burn-in test device usually uses a heating device to directly heat the test environment, electronic products closer to the heating device are more likely to be heated, while electronic products farther from the heating device are less likely to be heated. Also, since the burn-in test is very long, a uniform heating environment is extre...
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IPC IPC(8): G01R31/00
Inventor 范姜正王鸿基郭修玮林明贤
Owner 致茂电子(苏州)有限公司