Ultra-miniature parallel processor cable testing system and method

Abstract

The invention discloses an ultra-miniature parallel processor cable testing system and method. The system comprises a dynamic acquisition feedback device, a master end testing device and a slave end testing device. The dynamic acquisition feedback device is used for conducting dynamic monitoring and data result analyzing on information of a cable to be tested, wherein the information of the cable to be tested is obtained by the master end detecting device and the slave end testing device. The master end detecting device receives testing information issued by the dynamic acquisition feedback device and transmits the information of the cable to be tested to the dynamic acquisition feedback device after conducting stroke control amplification and digital-to-analog conversion on the information of the cable to be tested. The slave end testing device is used in cooperation with the master end testing device to complete internal resistance testing of the cable. The method comprises the steps that (1) the information of the cable to be tested is input; (2) the information of the cable to be tested is acquired; (3) the master end testing device transmits the information of the cable to be tested to the slave end testing device, and the master end testing device controls connection and disconnection of a relay through an actuator to complete testing; (4) testing results are compared with standard information, and a final result is given out. The embedded computer technology and the hardware circuit modularized design and communication technology are involved in the ultra-miniature parallel processor cable testing system and method, and the ultra-miniature parallel processor cable testing system and method are applicable to the occasions where various cables and various core wires exist and the space is limited.

Description

technical field [0001] The invention relates to an ultra-small parallel processor cable testing system and testing method, more specifically to embedded computer technology, hardware circuit modular design technology and communication technology, especially suitable for cables with many types, many core wires, and limited space. limited occasions. Background technique [0002] Cables with different performances and sizes are widely used in satellites, spacecraft, aircraft, ships and other large equipment. Cable is an important carrier for signal transmission and energy transmission of weapons and equipment. The power supply, signal, control, and communication transmission between equipment and system equipment are also completed through cables. The reliability of cable connections directly affects the completion of military training and combat tasks. efficiency. [0003] The traditional method of testing cables is to manually use tools such as multi-purpose meters and buzz...

AI Technical Summary

Problems solved by technology

[0005] For the defects and deficiencies in the above-mentioned background technology, the purpose of the present invention is to provide a kind of ultra-small parallel processor cable testing system and testing method, adopt multi-CPU processing system, double-layer high-capacity switching matrix, multi-channel parallel loading based on Constant current source high-precision internal resistance test and insulation test based on long-term high-voltage polarization solve the shortcomings of low detection efficiency, poor accuracy, and limited space in the existing technology

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