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66results about How to "Increase test rate" patented technology

Automatic test platform of high-speed ADC chip and test method

InactiveCN107290646AIncrease test rateReliable high-speed data signal transmissionAutomated test systemsPerformance indexTest platform
The invention discloses an automatic test platform of a high-speed ADC chip and a test method. The automatic test platform comprises an ADC daughter board, a test mother board, a FPGA core board, an upper computer, and a test device. The ADC daughter board comprises a device placing a tested ADC chip, an ADC chip basic working circuit and a lead-out chip interface connected with an ADC chip device. The basic working circuit ensures normal operation of the tested ADC chip. The lead-out chip interface leads out interfaces of the tested ADC chip and makes the interfaces connect with the test mother board through a high-speed interface, the interfaces of the tested ADC chip being required to measure. The test mother board is connected with the ADC daughter board and the FPGA core board. The FPGA core board is connected with the upper computer, and is used to complete tasks of program control and data processing. The upper computer communicates with the FPGA core board, and is used to control a test process. The test device comprises a signal source and a power supply, and provides signals and power required by the whole automatic test platform. The automatic test platform and the test method can rapidly test all performance indexes of high-speed ADC.
Owner:苏州迅芯微电子有限公司

Socket, test device and test method for testing electronic element packages with leads

The present invention relates to a socket, test device and test method for testing electronic element packages with leads, and particularly relates to a socket, test device and test method for testing image sensors with leads. The test device comprises a socket, a plurality of test probes and a test circuit board. The socket comprises a base having a plurality of first holes, a guiding structure having a plurality of second holes and at least one floating member used to connect the base and the guiding structure. In the socket, test device and test method of the present invention, each test probe is received into one first hole and one second hole to maintain the top surface of guiding structure to be even for preventing the deflective placing of the electronic element packages, and for preventing the damage to the test probes. The test probes are controlled by compressing the floating member for protruding form the top surface of the guiding structure and for providing a shorter delivering path of the electronic signals between the test circuit board and the electronic element packages. This shorter delivering path of the electronic signals can improve the accuracy and reliability of the test process for the electronic element packages with leads.
Owner:KING YUAN ELECTRONICS

Method for optimizing dynamic response performance of heat radiator of power device on basis of numerical iteration

The invention provides a method for optimizing the dynamic response performance of a heat radiator of a power device on the basis of numerical iteration. The method comprises the following steps of: a, building an integral Foster heat network model; b, obtaining a power circulation temperature curve according to the total response and the zero input response of the Foster heat network model; and c, building a heat radiator numeralization module through the power circulation temperature curve, and obtaining a heat network parameter of a physical heat radiator. The method has the advantages that the dynamic response performance of the heat radiator can be optimized; and the power circulation speed in an aging test is accelerated, or the junction temperature fluctuation amplitude in the actual use process is reduced, and the junction temperature fluctuation speed in the actual use process is decelerated, so that the requirement of power circulation speed regulation in different application occasions can be met. The test speed can be effectively accelerated. The junction temperature fluctuation can be effectively reduced when the method is applied to current converter external heat management.
Owner:CHONGQING UNIV

Ultra-miniature parallel processor cable testing system and method

The invention discloses an ultra-miniature parallel processor cable testing system and method. The system comprises a dynamic acquisition feedback device, a master end testing device and a slave end testing device. The dynamic acquisition feedback device is used for conducting dynamic monitoring and data result analyzing on information of a cable to be tested, wherein the information of the cable to be tested is obtained by the master end detecting device and the slave end testing device. The master end detecting device receives testing information issued by the dynamic acquisition feedback device and transmits the information of the cable to be tested to the dynamic acquisition feedback device after conducting stroke control amplification and digital-to-analog conversion on the information of the cable to be tested. The slave end testing device is used in cooperation with the master end testing device to complete internal resistance testing of the cable. The method comprises the steps that (1) the information of the cable to be tested is input; (2) the information of the cable to be tested is acquired; (3) the master end testing device transmits the information of the cable to be tested to the slave end testing device, and the master end testing device controls connection and disconnection of a relay through an actuator to complete testing; (4) testing results are compared with standard information, and a final result is given out. The embedded computer technology and the hardware circuit modularized design and communication technology are involved in the ultra-miniature parallel processor cable testing system and method, and the ultra-miniature parallel processor cable testing system and method are applicable to the occasions where various cables and various core wires exist and the space is limited.
Owner:NORTHWESTERN POLYTECHNICAL UNIV

Device obtaining direct current signals from alternative current and direct current superposition signals and method thereof

The invention discloses a device obtaining direct current signals from alternative current and direct current overlapped signals. The device obtaining the direct current signals from the alternative current and direct current overlapped signals comprises a controller which sends out control commands according to time sequence, a whole cycle sampling switch connected with the controller and being switched on and off according to the control commands outputted by the controller, an integral circuit connected with an output end of the whole cycle sampling switch, a sampling maintain switch, a sampling holder connected with the other end of the sampling maintain switch, wherein an integral capacitance on the integral circuit conducts integral sampling of inputted overlapped signals, and one end of the sampling maintain switch is connected with the output end of the integral circuit. After sampling of the integral circuit is finished, under the control of the controller, the whole cycle sampling switch is disconnected, the sampling maintain switch is closed, voltage of the integral capacitance is transferred to the sampling holder to be kept. The device obtaining the direct current signals from the alternative current and the direct current overlapped signals can eliminate power line interference of the overlapped signals, ensure test of the instrument not to be influenced by alternative current signals, and improve test speed.
Owner:CHANGZHOU TONGHUI ELECTRONICS

Optical fiber distributed polarization crosstalk rapid measurement device based on optical frequency domain interference

The invention belongs to the technical field of optical fiber measurement, and particularly relates to a distributed polarization crosstalk rapid measurement device based on optical frequency domain frequency shift interference, which comprises a tunable laser source module, a to-be-measured device module, a main interferometer module, an auxiliary interferometer module and a signal acquisition and analysis module. The device is characterized in that a tunable laser is used for carrying out rapid wavelength scanning, a main interferometer is used for carrying out frequency shift on an interference beat frequency signal, and the position and intensity of polarization crosstalk are respectively determined by obtaining the optical path difference between coupling light and transmission light and the amplitude of a normalized interference signal. And meanwhile, the problem of signal aliasing caused by 1/f flicker noise at a low frequency and light source sweep frequency nonlinearity is also eliminated. The tunable laser is combined to get rid of dependence on an optical path scanning delayer in polarization crosstalk measurement, an all-fiber structure without moving parts is realized, the reliability and stability of a test system are enhanced, and the speed and signal-to-noise ratio of polarization crosstalk measurement are greatly improved in principle.
Owner:GUANGDONG UNIV OF TECH

Multi-channel synthetic data chain optical fiber testing terminal and method

The invention discloses a multi-channel synthetic data chain optical fiber testing terminal and method. The testing terminal comprises a shell, a power module and a control board card, wherein the power module and the control board card are arranged in the shell. The control board card comprises a core controller, a power conversion module, a crystal oscillation circuit, a reset circuit, a configuration storage circuit, an optical fiber port interface, an internet access interface and a serial port interface, wherein the power conversion module, the crystal oscillation circuit, the reset circuit, the configuration storage circuit, the optical fiber port interface, the internet access interface and the serial port interface are connected with the core processor. The optical fiber port interface is connected with at least one set of optical fiber transmitting port and optical fiber receiving port formed in the front face of the shell, the internet access interface and the serial port interface are connected with a universal internet access and a universal serial port formed in the back face of the shell respectively, and the power module is connected with a power socket arranged on the back face of the shell. Compared with the prior art, the multi-channel synthetic data chain optical fiber testing terminal and method have the advantages that the testing rate for test equipment can be increased through the multi-channel synthetic data chain optical fiber testing terminal, high flexibility is achieved, test data can be configured in real time through upper computer software, and application prospects are broad.
Owner:CHENGDU AEROSPACE COMM EQUIP CO LTD

Method and system for testing response time of radio frequency switch chip

The invention discloses a method and a system for testing response time of a radio frequency switch chip. The method comprises the steps that: an ATE radio frequency signal source outputs a transmitted signal to a to-be-tested radio frequency switch at preset frequency and power; a digital signal processor outputs a DUT control signal to the to-be-tested radio frequency switch to control the stateof the to-be-tested radio frequency switch; an ATE radio frequency receiver receives a transmitted signal output by the to-be-tested radio frequency switch, processes the received signal, and sends the processed received signal to a digital signal processor; and the digital signal processor processes the processed received signal and outputs a test result. The system comprises the digital signalprocessor, the ATE radio frequency signal source, the ATE radio frequency receiver and the to-be-tested radio frequency switch. According to the method and the system, digital domain processing is carried out on the basis of the signal receiver, the influence of the time response of a detector and the influence of the analysis bandwidth of an oscilloscope are avoided, the bandwidth of a processable signal is wide, the test rate of ATE equipment is improved, and the hardware complexity is reduced.
Owner:佛山市联动科技股份有限公司

Rapid detection system and method for fluoride ions in water

The invention belongs to the technical field of ion detection equipment, and provides a rapid detection system for fluoride ions in water. The system comprises a man-machine interaction unit, a temperature collection unit, a load power management unit, a heating stirring unit and a voltage regulation unit which are connected with a microprocessor unit. The system further comprises a fluorine ion electrode unit, and a voltage value measured by the fluorine ion electrode unit is transmitted to the microprocessor unit after being conditioned by a signal conditioning unit; the microprocessor unit comprises an operation module, and the operation module comprises a temperature compensation module, a linear computation module, a calculation correction module and a temperature compensation correction module. The invention further discloses a rapid detection method for fluoride ions in water adopting the rapid detection system for fluoride ions in water. According to the system and method, the concept is ingenious, operation is easy and convenient, and the technical problems that measurement of the content of fluoride ions in the prior art is completed mainly depending on a laboratory, the operation flows are complex, the precision is poor, secondary pollution is easily caused during withdrawing measurement, and accuracy is affected.
Owner:CENT FOR HYDROGEOLOGY & ENVIRONMENTAL GEOLOGY CGS

Non-signaling coupling test method and system

The invention discloses a non-signaling coupling test method and system, and relates to the field of non-signaling coupling test. The system comprises a to-be-tested terminal, a control terminal and acomprehensive tester; the to-be-tested terminal comprises: a parameter receiving module which receives configuration parameters sent by the control terminal and used for a non-signaling coupling testthrough Wi-Fi; a communication connection module which is used for entering a test mode after receiving the configuration parameters and disconnecting Wi-Fi connection with the control terminal;apower transmitting module which is used for sequentially transmitting Wi-Fi signals with corresponding power according to the configuration parameters; a power receiving module which is used for reading the received power of each Wi-Fi signal sent by the comprehensive tester to obtain corresponding receiving power and storing the corresponding receiving power locally; a communication connection modulewhich quits the test mode and is connected with the control terminal again through Wi-Fi after sending the Wi-Fi signal according to the configuration parameter; and an information sending module which is used for sending each receiving power stored locally to the control terminal. According to the invention, one-stop test can be realized, and the test rate is improved.
Owner:GUANGDONG XIAOTIANCAI TECH CO LTD

A test fixture for a loopback function of a communication terminal

The invention provides a test fixture for a loopback function of a communication terminal, which is configured to test whether a loopback function of a terminal to be tested is qualified. The test fixture comprises a displaying module, and the test fixture further comprises: a triggering module, configured to send a test instruction; a processing module, electrically connected to the triggering module, and configured to send a loopback instruction and a test message according to the test instruction, wherein the loopback instruction is configured to order the terminal to be tested to return and send the received test message; and an interface module, electrically connected with the processing module and the terminal to be tested, and configured to access to the terminal to be tested so as to connect the terminal to be tested with the processing module. The processing module is further electrically connected to the displaying module, and the processing module is configured to send a qualified test result to the displaying module in the case that the test message returned and sent by the terminal to be tested is received; and the processing module is further configured to send an unqualified test result to the displaying module in the case that the test message is not received within first preset time.
Owner:湖州帷幄知识产权运营有限公司
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