Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Multi-station synchronous test system for testing quartz crystal oscillator by continuously raising temperature

A quartz crystal, synchronous testing technology, applied in the direction of instruments, measuring electricity, measuring devices, etc., can solve the problems of measurement efficiency limitation, reliability impact, etc. Effect

Active Publication Date: 2012-04-11
NANJING CHINA ELECTRONICS PANDA CRYSTAL TECH CORP
View PDF4 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The current test system uses mechanical rotation to achieve multi-station measurement, but the reliability of this measurement method is affected. At the same time, due to the time required for mechanical rotation, the measurement efficiency is also limited.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-station synchronous test system for testing quartz crystal oscillator by continuously raising temperature
  • Multi-station synchronous test system for testing quartz crystal oscillator by continuously raising temperature
  • Multi-station synchronous test system for testing quartz crystal oscillator by continuously raising temperature

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0021] in the attached figure 2 The top layer PCB board for pressing the quartz crystal oscillator 1, the third layer PCB board for fixing the quartz crystal oscillator 2, the second layer PCB board for positioning nuts and protection probes 3, the circuit signal for 80 oscillators of the same type are placed on a set of PCB boards composed of the bottom PCB board 4 for transmission and control, and then the attached figure 2 The top layer PCB board for pressing the quartz crystal oscillator 1, the third layer PCB board for fixing the quartz crystal oscillator 2, the second layer PCB board for positioning nuts and protection probes 3, the circuit signal for The bottom PCB board 4 for transmission and control is combined into a set of signal control lines, power lines, frequency output lines and figure 2 The signal control PCB total board 8-phase connection, figure 2 The signal control PCB total board 8 in the can be connected simultaneously by the attached figure 2 The...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a multi-station synchronous test system for testing a quartz crystal oscillator by continuously raising temperature. The system is characterized in that a signal output end of a computer is connected with a signal input end of a USB (Universal Serial Bus) digital I / O (Input / Output) converter; the signal output end of the USB digital I / O converter is connected with the signal input end of a PCB (Printed Circuit Board) structure, and the signal output end of the PCB structure is connected with the signal input end of a frequency meter; the signal output end of the frequency meter is connected with the signal input end of the computer, and a power output end is connected with a power input end of the PCB structure. The multi-station synchronous test system provided by the invention has the advantages that: a unique circuit structure design and a matched software design are adopted and digital control of an output frequency is adopted, the test frequency and reliability are optimized, and a good method for detecting frequency hopping of the quartz crystal oscillator in batch is provided.

Description

technical field [0001] The invention relates to a multi-station synchronous testing system which can be used for the continuous temperature rise test of the quartz crystal oscillator, and is applied to a large batch of production lines to quickly and stably detect the temperature-frequency characteristics of the quartz crystal oscillator. Background technique [0002] With the further development of science and technology, technology has higher and higher requirements for the reliability and precision of components, and as a high-precision frequency source, quartz crystal oscillators have more and more requirements for its stability and precision. high. As an important indicator of the stability of quartz crystal oscillators, the stability of temperature-frequency characteristics has become the focus of many manufacturers who use quartz crystal oscillators. Therefore, a fast and reliable test method has become the pursuit of manufacturers who produce quartz crystal oscillat...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/01G01R1/04
Inventor 唐小林王后峰高志祥
Owner NANJING CHINA ELECTRONICS PANDA CRYSTAL TECH CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com