Device obtaining direct current signals from alternative current and direct current superposition signals and method thereof

A technology of superimposing signals and DC signals, which is applied to measuring devices, instruments, measuring electrical variables, etc., and can solve problems such as blocking AD sampling circuits and weak test signals

Active Publication Date: 2013-05-08
CHANGZHOU TONGHUI ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In addition, because the test signal is extremely weak, the amplification ratio of the above circuit is very high. When the test signal is amplified, the interference signal is amplified at the same time, so as to block the work of the AD sampling circuit.

Method used

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  • Device obtaining direct current signals from alternative current and direct current superposition signals and method thereof
  • Device obtaining direct current signals from alternative current and direct current superposition signals and method thereof
  • Device obtaining direct current signals from alternative current and direct current superposition signals and method thereof

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Embodiment Construction

[0032] refer to Figure 3 to Figure 4 According to the present invention, a device for extracting DC signals from AC and DC superimposed signals includes a controller that sends out control instructions according to timing, and the controller is a CPU or a sequential logic circuit. as well as

[0033] The full-period sampling switch K1 connected to the controller is closed or opened according to the control command output by the controller, and the closing time of the full-period sampling switch is equal to the period of the interference signal. as well as

[0034] An integration circuit connected to the output end of the full-cycle sampling switch, during which the full-cycle sampling switch is closed, the integration capacitor on the integration circuit performs integral sampling for the input superimposed signal. Since the closing time of the sampling switch in the whole cycle is equal to the period of the interference signal, in the sampling signal, the AC signal in th...

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Abstract

The invention discloses a device obtaining direct current signals from alternative current and direct current overlapped signals. The device obtaining the direct current signals from the alternative current and direct current overlapped signals comprises a controller which sends out control commands according to time sequence, a whole cycle sampling switch connected with the controller and being switched on and off according to the control commands outputted by the controller, an integral circuit connected with an output end of the whole cycle sampling switch, a sampling maintain switch, a sampling holder connected with the other end of the sampling maintain switch, wherein an integral capacitance on the integral circuit conducts integral sampling of inputted overlapped signals, and one end of the sampling maintain switch is connected with the output end of the integral circuit. After sampling of the integral circuit is finished, under the control of the controller, the whole cycle sampling switch is disconnected, the sampling maintain switch is closed, voltage of the integral capacitance is transferred to the sampling holder to be kept. The device obtaining the direct current signals from the alternative current and the direct current overlapped signals can eliminate power line interference of the overlapped signals, ensure test of the instrument not to be influenced by alternative current signals, and improve test speed.

Description

technical field [0001] The invention relates to a device and method for extracting DC signals from AC and DC superposition signals. Background technique [0002] The insulation resistance test is to connect a DC voltage to both ends of the component under test, and calculate the insulation resistance of the component through the current and voltage at both ends of the component. During the test, the DUT is basically in a high-impedance state and is close to an open circuit. The test sampling input impedance is very high, and it is very sensitive to the electromagnetic interference of the environment. Since the DC voltage related to the measured current is 0.1-10mVDC, through the measurement of the actual circuit, it is found that the interference of the circuit is mainly divided into two parts, the main part is power frequency interference (20mVp), and the other part is white noise (5mVp). And the amplitude of white noise is much smaller than power frequency interference. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/14G01R15/00
Inventor 吴强刘瑜樊义孙伯乐赵浩华高志齐
Owner CHANGZHOU TONGHUI ELECTRONICS
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