Test method and system for column driver chip

Abstract

The invention relates to a column driver chip testing method and a column driver chip testing system. The method comprises the following steps: a, the impedance between voltage ports of a tested column piece is tested, the method goes to subsequent steps if all circuits are open, or the tested column piece is defective, and follow-up test is terminated; b, the tested column piece is inserted into a socket of an addressing electrode driving plate on a display screen module, power supplies are switched on, whether the levels of six output test points of the tested column piece are low is measured by a testing plate on the display screen module, the method goes to subsequent steps if the levels of the six output test points of the tested column piece are low, or the tested column piece is defective, and follow-up test is terminated; and c, on the testing plate, a chip enabling port and a low output control port are connected to a logic power supply, a high-voltage output control port is connected to a logic ground, whether the levels of the six output test points of the tested column piece are high is measured, the method goes to subsequent steps if the levels of the six output test points of the tested column piece are high, or the tested column piece is defective, and follow-up test is terminated. The requirements for testing of all performance parameters of the column piece are fully satisfied by conveniently and flexibly adjusting control signals.

Description

technical field [0001] The invention relates to a testing method and system for a plasma display screen, in particular to a testing method and system for a column drive chip in a plasma display screen. Background technique [0002] Plasma Display (PDP) is one of the mainstream flat panel display devices in the market at present. When the PDP is displaying images, it is necessary to apply high-voltage and large-current pulses to the screen electrodes. The role of the column driver chip (TCP, hereinafter referred to as "column chip") is to provide certain periodic high-voltage and high-current pulses to the data (data) electrodes of the PDP screen according to the image data under the control of low-voltage signals, so as to realize each image unit. Periodic discharge glows and extinguishes. [0003] The input control signals of the chip include low swing differential (RSDS) data signal, clock, energy recovery enable (corresponding to port CSE), input strobe (corresponding t...

AI Technical Summary

Problems solved by technology

[0005] The disadvantage of this method is: on the one hand, the frequency and phase of the clock and energy recovery enable (CSE), input strobe (STB) and other signals obtained by the tested array are either fixed and non-adjustable, or adjustable It is too narrow to meet the needs of performance testing for a certain special and extreme state; -Change-Re-Verify" initial stage of the cycle, there is no need to bind the screen every time and then do the test

Obviously, if the relative phase difference between energy recovery enable (CSE) and input strobe (STB) is fixed, the test cannot be done according to the requirements

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