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A high stability and large dynamic 1 mm s-parameter test system

A parameter test and large dynamic technology, applied in the test field, to achieve the effect of solving high-power local oscillator output, improving dynamic range, and improving stability

Active Publication Date: 2017-09-15
CHINA ELECTRONIS TECH INSTR CO LTD
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Problems solved by technology

[0005] The present invention proposes a highly stable and large dynamic 1mm S-parameter test system, which solves the problem of how to maintain the high stability of the spread spectrum device and improve the dynamic range at the same time that the current 1mm S-parameter test system needs to solve

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  • A high stability and large dynamic 1 mm s-parameter test system
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  • A high stability and large dynamic 1 mm s-parameter test system

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Embodiment Construction

[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0020] Existing 1mm S-parameter test systems are all based on microwave test instruments, plus a 1mm spread spectrum device. How to realize a large dynamic and high stability 1mm S-parameter spread spectrum device is the first problem to be solved in the current 1mm S-parameter test system. The receiving channel and reference channel of the 1mm S-parameter test device adopt a low-order harmonic mixing scheme. Since the mixer has low conversion loss, the spread...

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Abstract

The invention proposes a highly stable and large dynamic 1 mm S parameter testing system, which adopts a split structure, including: vector network analyzer host, vector network analyzer spread spectrum control machine and 140GHz-325GHz S parameter spread spectrum module; S parameter The spread spectrum module includes a 140GHz‑220GHz and 220GHz‑325GHz signal generating unit, a signal receiving unit and a signal separating unit. The high stability and large dynamic 1 mm S parameter test system of the present invention adopts the low-order harmonic frequency mixing scheme to improve the dynamic range of the system; at the same time, the local oscillator frequency multiplication link uses the space multi-layer frequency multiplication technology to distribute the driving power through the space, and in the Without increasing the power of the single-layer frequency multiplier link, the compression point of the entire frequency multiplier is improved, the problem of high-power local oscillator output is solved, and the stability of the spread spectrum device is also improved.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a highly stable and large dynamic 1 mm S parameter testing system. Background technique [0002] Because the millimeter wave system has the characteristics of small size, narrow beam, large capacity, high resolution, strong anti-interference ability and good confidentiality, it has important strategic significance in military and civilian applications. With the development of millimeter wave and submillimeter wave With the development and wide application of optoelectronic technology, the electromagnetic spectrum has expanded rapidly, and the electromagnetic spectrum has developed from the extremely low frequency to the 1 mm frequency band. The frequency range of the 1mm signal is 140GHz to 325GHz, which is located at the high end of the millimeter wave signal and the low end of the terahertz signal. It contains multiple atmospheric windows and has broad application prospects in ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 邓建钦年夫顺姜万顺陈卓王沫辛海鸣
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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