Test method and test system for implementing COMMAND-mode MIPI (mobile industry processor interface) modules
A module testing, module technology, applied in instruments, static indicators, etc., to achieve the effect of ensuring accuracy
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[0026] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0027] Such as figure 1 Shown, a kind of MIPI module test system of the present invention realizes COMMAND mode, comprises PG image generator 1, MCU2 and FPGA3, PG image generator 1 is connected with MCU2 and FPGA3 respectively, MCU2 and FPGA3 are connected by EBI interface, FPGA3 passes through The bridge chip 4 is connected with the MIPI module 5,
[0028] PG image generator 1 is used to set register configuration parameters and image data;
[0029] MCU2 is used to convert the register configuration parameters received from PG image generator 1 into DCS instructions and send them to FPGA3;
[0030] FPGA3 is used to pack the image data received from PG image generator 1 with DCS instructions and send them to bridge chip 4 . FPGA3 includes EBI module 3-1, data processing module 3-2 and timing interface circuit 3-3. The EBI module ...
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