Microwave device reliability testing device and testing method thereof

A technology of microwave devices and testing devices, which is applied in the direction of measuring devices, instruments, measuring electronics, etc., can solve the problems that the life test cannot be applied, and the self-excited phenomenon of the device cannot be fundamentally eliminated, so as to eliminate the self-excited phenomenon, easy to realize, The effect of ensuring accuracy

Active Publication Date: 2017-02-15
THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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  • Claims
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Problems solved by technology

This method cannot fundamentally eliminate the self-excitation phenomenon of the device
At the same time, because the peripheral circuit of the device cannot withstand high temperature, this method cannot be applied to high temperature accelerated life test

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  • Microwave device reliability testing device and testing method thereof

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Embodiment Construction

[0022] The technical solutions in the embodiments of the present invention are clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0023] In the following description, a lot of specific details are set forth in order to fully understand the present invention, but the present invention can also be implemented in other ways different from those described here, and those skilled in the art can do it without departing from the meaning of the present invention. By analogy, the present invention is therefore not limited to the specific examples disclosed below.

[0024] Such as figure ...

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Abstract

The invention discloses a reliability testing device and a testing method thereof for microwave devices and relates to the technical field of devices or methods for measuring electrical variables. The method includes steps of selecting filter capacitors of a microwave device, sintering the filter capacitors in a pipe shell, sintering a pipe core of the microwave device in the pipe shell, bonding the filter capacitors on an input terminal of the pipe shell, bonding the pipe core on an input terminal and an output terminal of the pipe shell, connecting the pipe shell with the microwave device, testing direct-current parameters of the microwave device, observing a testing curve, launching an acceleration power ageing test, and testing by a high-frequency millivoltmeter and observing. In the method, the filter capacitors are arranged in the pipe shell, different capacitor combinations are selected according to different microwave devices, and self-excitation of the microwave devices during reliability testing is eliminated. Meanwhile, by adopting the sintering process, the chip and the filter capacitors, the microwave devices are capable of working at the high-temperature states and high-temperature acceleration life test can be carried out.

Description

technical field [0001] The invention relates to the technical field of devices or methods for measuring electrical variables, in particular to a microwave device reliability testing device and a testing method thereof. Background technique [0002] Microwave devices can be produced based on semiconductor materials. In order to verify the reliability of microwave devices, it is necessary to carry out high-temperature reverse bias, power aging and other tests. During the test, it is often found that the device has self-excitation phenomenon. Self-excitation can easily cause device instability, or even burn. At the same time, in the test process before and after the reliability test, the existence of self-excitation phenomenon will lead to inaccurate test results. [0003] Microwave devices are devices that amplify microwave signals. When conducting reliability tests, a certain DC operating voltage, such as 8V, 28V, 36V, etc., needs to be applied to the device. The DC operatin...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 李亮默江辉崔玉兴付兴昌蔡树军杨克武
Owner THE 13TH RES INST OF CHINA ELECTRONICS TECH GRP CORP
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