Microwave device reliability testing device and testing method thereof

Abstract

The invention discloses a reliability testing device and a testing method thereof for microwave devices and relates to the technical field of devices or methods for measuring electrical variables. The method includes steps of selecting filter capacitors of a microwave device, sintering the filter capacitors in a pipe shell, sintering a pipe core of the microwave device in the pipe shell, bonding the filter capacitors on an input terminal of the pipe shell, bonding the pipe core on an input terminal and an output terminal of the pipe shell, connecting the pipe shell with the microwave device, testing direct-current parameters of the microwave device, observing a testing curve, launching an acceleration power ageing test, and testing by a high-frequency millivoltmeter and observing. In the method, the filter capacitors are arranged in the pipe shell, different capacitor combinations are selected according to different microwave devices, and self-excitation of the microwave devices during reliability testing is eliminated. Meanwhile, by adopting the sintering process, the chip and the filter capacitors, the microwave devices are capable of working at the high-temperature states and high-temperature acceleration life test can be carried out.

Description

technical field [0001] The invention relates to the technical field of devices or methods for measuring electrical variables, in particular to a microwave device reliability testing device and a testing method thereof. Background technique [0002] Microwave devices can be produced based on semiconductor materials. In order to verify the reliability of microwave devices, it is necessary to carry out high-temperature reverse bias, power aging and other tests. During the test, it is often found that the device has self-excitation phenomenon. Self-excitation can easily cause device instability, or even burn. At the same time, in the test process before and after the reliability test, the existence of self-excitation phenomenon will lead to inaccurate test results. [0003] Microwave devices are devices that amplify microwave signals. When conducting reliability tests, a certain DC operating voltage, such as 8V, 28V, 36V, etc., needs to be applied to the device. The DC operatin...

AI Technical Summary

Problems solved by technology

This method cannot fundamentally eliminate the self-excitation phenomenon of the device

At the same time, because the peripheral circuit of the device cannot withstand high temperature, this method cannot be applied to high temperature accelerated life test

Images