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X-ray shooting system for high-resolution differential phase-contrast imaging of inspection objects

A photographing system and differential phase contrast technology, applied in the field of X-ray photographing systems, can solve problems such as cost, and achieve the effect of flexible layout and high position resolution

Inactive Publication Date: 2018-12-14
SIEMENS AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The method is costly

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  • X-ray shooting system for high-resolution differential phase-contrast imaging of inspection objects
  • X-ray shooting system for high-resolution differential phase-contrast imaging of inspection objects
  • X-ray shooting system for high-resolution differential phase-contrast imaging of inspection objects

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Embodiment Construction

[0061] exist Figure 5 The figure now shows an exemplary embodiment according to the invention, in which a small PCI detector 25 is used in addition to a normal-sized X-ray imaging detector 4 , which may have dimensions of, for example, 5 cm×5 cm. On the PCI detector 25 and structurally connected to the PCI detector 25, a grating G of similar size (not shown in this figure) is provided. 1 and G 2 . The small PCI detector 25 is introduced, if necessary, into the beam path of the coherent x-rays 12 and is arranged here upstream of the larger x-ray imaging detector 4 for conventional absorption imaging. The small PCI detector 25 can be moved manually or motor-driven by means of a device not shown into the beam path of the x-rays 12 in front of the large x-ray imaging detector 4 and passed through the input surface of the large x-ray imaging detector 4 at the double arrow 26 move in the direction of . The mini-PCI detector 25 can be connected to the x-ray system via a cable 27...

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Abstract

The present invention relates to an X-ray shooting system for performing high-resolution PCI on an inspection object, comprising: at least one X ray emitter generating quasi-coherent X rays; an X ray imaging detector having an input surface which is sensitive to radiation and effective to X ray imaging and pixels arranged into an array; a diffraction or phase grating arranged between the inspection object and the X ray imaging detector; an analyzer grating arranged correspondingly for the diffraction or phase grating; and an image system used for controlling the X ray imaging detector and receiving and processing an image signal of the X ray imaging detector. The phase grating and the analyzer grating have such size that the phase grating and the analyzer grating cover only a part of the input surface of the X ray imaging detector, the image system is configured to take the read and processed part of the input surface of the X ray imaging detector, which is covered with the gratings, as a partial region used for phase-contrast imaging, and to read and process other region of the X ray imaging detector so as to facilitate absorbing imaging based on X rays.

Description

technical field [0001] The invention relates to an x-ray imaging system for differential phase-contrast imaging of an examination object, which has: at least one x-ray emitter for generating quasi-coherent x-rays; An X-ray imaging detector with pixels on the input surface and arranged in an array; a diffraction or phase grating arranged between the inspection object and the X-ray imaging detector; an analyzer grating corresponding to the diffraction or phase grating; And an image system for controlling the X-ray imaging detector and receiving and processing the image signal of the X-ray imaging detector. Background technique [0002] For differential phase contrast imaging (PCI), three gratings are usually introduced into the optical path of the X-ray source. In the article "Soft-tissue phase-contrast tomography with an X-ray tube" published by M. Bech et al. in Phys.Med.Biol.54 (2009), pp. 2747 to 2753, this kind of Embodiments for PCI will be further described below. ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): A61B6/03G01N23/04
CPCG01N23/20075A61B6/4035A61B6/4233A61B6/4241A61B6/4291A61B6/4441A61B6/484A61B6/587
Inventor M.霍黑塞尔K.克林根贝克
Owner SIEMENS AG