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Tandem time-of-flight mass spectrometry with non-uniform sampling

A time-of-flight mass spectrometry, tandem technology, used in time-of-flight spectrometers, methods using particle spectrometers, mass spectrometers, etc.

Active Publication Date: 2015-04-08
LECO CORPORATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] In summary, the existing TOF-TOF tandem device has not yet achieved parallel "full mass" analysis while using high-resolution multi-reflection TOF analyzers at both stages

Method used

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  • Tandem time-of-flight mass spectrometry with non-uniform sampling
  • Tandem time-of-flight mass spectrometry with non-uniform sampling
  • Tandem time-of-flight mass spectrometry with non-uniform sampling

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Embodiment Construction

[0043] Figure 1-A An exemplary multiplexed tandem multiple reflection time-of-flight (MR-TOF) mass spectrometer 11 is shown. According to some implementations, the MR-TOF mass spectrometer 11 comprises a multiple reflection time-of-flight (MR-TOF) analyzer, which in turn has two parallel-aligned ion mirrors 12 (although planar here for the sake of explanation, can also be cylindrical), a drift space and a periodic lens 14 between the mirrors 12 . The MR-TOF mass spectrometer 11 also includes a pulsed ion source 15 , a multiplexing time selector 16 , a fragmentation unit 17 , a detector 18 and a non-redundant multiplexing data system 20 . Average ion trajectories for precursor ions are shown as solid lines 19P and average ion trajectories for fragment ions are shown as dashed lines 19F.

[0044] The pulsed ion source 15 may be, for example: (a) a radio frequency (RF) ion trap with radial or axial ion emission that traps ions or passes a continuous stream of ions at low ion en...

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Abstract

A method and apparatus are disclosed for parallel all-mass tandem mass spectrometry employing multi-reflecting time-of-flight analyzer for both MS stages, preferably arranged within the same analyzer to secure ultra-high resolution. Sensitivity and speed of TOF-TOF tandem are enhanced by non-redundant multiplexing based on signal sparseness and on avoiding repetitive signal overlaps at multiple repetitions of true fragment signals. Non-redundant matrices of gate and delay timing are constructed by extending orthogonal Latin square matrices. The method is generalized for multiplexing of any multiple repetitive signal sources being sparse either spectrally, or spatially, or in time.

Description

[0001] Cross References to Related Applications [0002] This International Patent Application claims the benefit of US Provisional Application 61 / 661,268, filed June 18, 2012. The disclosure of this prior application is considered part of the disclosure of the present application and is hereby incorporated by reference in its entirety. technical field [0003] The present application relates generally to the field of mass spectrometry, and more particularly to improvements in the sensitivity, resolution, speed and / or dynamic range of tandem time-of-flight mass spectrometers. Background technique [0004] Tandem mass spectrometry (MS-MS) uses separation of precursor ions in a first mass spectrometer (MS1), fragmentation of the separated species, and mass analysis of the fragment ions in a second mass spectrometer (MS2) to Perform compound identification and structural studies. Current applications of tandem mass spectrometry in the life sciences encounter the challenge of ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/00H01J49/10H01J49/40
CPCH01J49/0027H01J49/0081H01J49/406H01J49/0031H01J49/005H01J49/10
Inventor A·N·维伦切考夫V·马卡洛夫
Owner LECO CORPORATION
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