Tandem time-of-flight mass spectrometry with non-uniform sampling

Abstract

A method and apparatus are disclosed for parallel all-mass tandem mass spectrometry employing multi-reflecting time-of-flight analyzer for both MS stages, preferably arranged within the same analyzer to secure ultra-high resolution. Sensitivity and speed of TOF-TOF tandem are enhanced by non-redundant multiplexing based on signal sparseness and on avoiding repetitive signal overlaps at multiple repetitions of true fragment signals. Non-redundant matrices of gate and delay timing are constructed by extending orthogonal Latin square matrices. The method is generalized for multiplexing of any multiple repetitive signal sources being sparse either spectrally, or spatially, or in time.

Description

[0001] Cross References to Related Applications [0002] This International Patent Application claims the benefit of US Provisional Application 61 / 661,268, filed June 18, 2012. The disclosure of this prior application is considered part of the disclosure of the present application and is hereby incorporated by reference in its entirety. technical field [0003] The present application relates generally to the field of mass spectrometry, and more particularly to improvements in the sensitivity, resolution, speed and / or dynamic range of tandem time-of-flight mass spectrometers. Background technique [0004] Tandem mass spectrometry (MS-MS) uses separation of precursor ions in a first mass spectrometer (MS1), fragmentation of the separated species, and mass analysis of the fragment ions in a second mass spectrometer (MS2) to Perform compound identification and structural studies. Current applications of tandem mass spectrometry in the life sciences encounter the challenge of ...

Images